A comparative study of the spectra recorded at RRCAT synchrotron BL-8 dispersive EXAFS beamline with other beamlines
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c Indian Academy of Sciences
— journal of physics
Vol. 80, No. 1 January 2013 pp. 159–171
A comparative study of the spectra recorded at RRCAT synchrotron BL-8 dispersive EXAFS beamline with other beamlines ABHIJEET GAUR1,∗ , B D SHRIVASTAVA1 , S N JHA2 , D BHATTACHARYYA2 and A POSWAL2 1 School
of Studies in Physics, Vikram University, Ujjain 452 001, India Spectroscopy Division, Bhabha Atomic Research Centre, Mumbai 400 085, India ∗ Corresponding author. E-mail: [email protected] 2 Applied
MS received 13 February 2012; revised 3 July 2012; accepted 24 July 2012 Abstract. The aim of the present work is to make a comparative study of the EXAFS spectra recorded at the BL-8 dispersive EXAFS beamline at 2 GeV Indus-2 synchrotron source at RRCAT, Indore (India) with those recorded at other synchrotron EXAFS beamlines, viz., X-19A at NSLS, BNL (USA), EXAFS wiggler beamline 4-1 at the SSRL (USA) and beamline 11.1 at ELETTRA (Italy). For this purpose, EXAFS spectra at Cu K-edge in copper metal have been recorded at these four beamlines. Further, EXAFS spectra at Cu K-edge in a copper complex have also been recorded at BL-8 beamline and beamline 11.1 at ELETTRA (Italy). The obtained experimental μ(E) data have been background-subtracted and then normalized. The normalized data have been then converted to χ (k) data, which have been Fourier-transformed and then fitted with the theoretical model, thereby yielding different structural parameters. It has been shown that the results obtained from the EXAFS spectra recorded at the BL-8 beamline are comparable with those obtained from other synchrotron EXAFS beamlines and also with the crystallographic results reported by earlier workers. The reliability, usefulness and data quality of the BL-8 beamline have been discussed. Keywords. Energy-dispersive extended X-ray absorption fine-structure spectroscopy; beamline BL-8; Cu metal; Cu complex. PACS No. 78.70.Dm
1. Introduction X-ray absorption spectroscopy (XAS) refers to the details of how X-rays are absorbed by an atom at energies near and above the core-level binding energies of that particular atom. XAS is the modulation of an atom’s X-ray absorption probability due to the chemical and physical states of the atom. The XAS is typically divided into two regimes: X-ray absorption near-edge spectroscopy (XANES) and extended X-ray absorption finestructure spectroscopy (EXAFS). The term X-ray absorption fine structure (XAFS) is DOI: 10.1007/s12043-012-0464-5; ePublication: 9 January 2013
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Abhijeet Gaur et al a broad term that comprises both these spectroscopies [1,2]. XAFS spectroscopy is a unique tool for studying, at the atomic and molecular scales, the local structure around selected elements that are contained within a material. It can be applied not only to crystals, but also to materials that possess little or no long-range translational order: amorphous systems, glasses, quasicrystals, disordered films, membranes, solutions, liquids, metalloproteins – even molecular gases. This versatility allows it to be us
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