A new Apparatus for Dynamical Ion Beam Mixing

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A NEW APPARATUS FOR DYNAMICAL ION BEAM MIXING M. JAULIN, G. LAPLANCHE, J. DELAFOND Laboratoire de Mdtallurgie Physique (U.A. 131, CNRS) 40, Avenue du Recteur Pineau 86022 POITIERS (France) S. PIMBERT-MICHAUX, UNIREC B.P. 50, 42702 FIRMINY (France)

A new apparatus in

our

laboratory.

for dynamical ion beam mixing has been developed The

system

is

based

on

deposition

sputtering concurrently with ion beam implantation.

It

by

ion beam

operates under

a vacuum of 10.5 Pa before deposition and 10.3 Pa during deposition. The ion source,

with a cross section area of 45 cm2 , produces a

high current intensity (up to 250 mA) eV).

It

is

deposition, For

at low energy (a few eV to 2000

possible to use either inert or reactive

species

for the

depending on the required application. the

ion

beam

mixing,

we

use

a

classical

implantor

with

energies range from 20 to 200 keV. This materials,

technique

allows

us

to

synthesize

deposits

of

different

either from pure elements or from compounds.

We will apply this technique to develop two types of coatings titanium carbide and silicon carbide. Microstructural (TEM)

on

0.1

investigations

gm

analysis thick

by

layers

Transmission have

been

Electron

performed

Microscopy as

well

as

of the tribological behavior of 1 jum thick coatings on

steel substrate (wear tests).

1. INTRODUCTION

of

Ion implantation is a very useful technique for the modification surface properties of materials such as wear and corrosion.

However,

the small thickness of the implanted layer (about 0,1 Jim)

sputtering from the surface, implanted atoms, To

and

which impose a maximum concentration of

are the two major limitations of this process.

overcome

these

problems,

new

techniques

which

involve

ion

implantation combined with a simultaneous deposition method are being developed

(1,2,3,4,5,6).

refractory

carbides,

Now coatings are

of

of hard materials,

increasing

applications. Mat. Res. Soc. Symp. Proc. Vol. 128. 91989 Materials Research Society

interest

for

especially industrial

92

So,

in

a new piece

this paper,

thin

adherent

films

and

uses

the

technique

temperature

of

is presented.

dynamical ion beam mixing (D.I.M.)

vapor deposited from bulk

and silicon carbide films,

Titanium

that synthesizes

of apparatus low

materials by

sputtering and assisted by a high energy Ar+ ion beam,

are studied.

The tribological behavior of these films is characterized

by

tests

wear

and

their

by

microstructure

Electron

Transmission

Microscopy experiments. 2. EXPERIMENTAL PROCEDURES 2.1. The sputtering evaporator It

consists of the following points

* A vacuum system

controlled by

a diffusion

pump,

capable

of

achieving a residual pressure of 5.105 Pa when the ion source is not operating and 5.103 Pa during deposition. source

* An ion beam originally

developed

as

of Kaufman ion

type

thruster

(7)

for

(Oxford

space

instrument)

propulsion

and

optimized to obtain the highest ion beam flux for a given gas flow and