A study of (111) oriented epitaxial thin films of In 2 O 3 on cubic Y-doped ZrO 2 by synchrotron based x-ray diffraction
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i: 10.1557/jmr.2012.162, Published by Cambridge University Press, 8 June 2012. In the article by Regoutz et al.,1 a (1026) reflection is indicated throughout the text. The correct reflection is (1026) in all instances.
REFERENCE 1. A. Regoutz, K.H.L. Zhang, R.G. Egdell, D. Wermeille, and R.A. Cowley: A study of (111) oriented epitaxial thin films of In2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction. J. Mater. Res. 27, 2257–2264 (2012) doi: 10.1557/jmr.2012.162.
The publisher regrets the error.
DOI: 10.1557/jmr.2012.270 J. Mater. Res., Vol. 27, No. 18, Sep 28, 2012
Ó Materials Research Society 2012
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