Abstracts for December 1999 Journal of Materials Research
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Volume 14, Number 6
TABLE OF CONTENTS SPECIAL SECTION: NANOINDENTATION
RAPID COMMUNICATIONS
Indentation plastic displacement field: Part I. The case of soft films on hard Substrates T.Y. Tsui, J. Vlassak, W.D. Nix
Subsolidus phase equilibria in the La 2 0 3 -Ga 2 03-NiO System M. Hrovat, S. Bernik, J. Hole, Z. Samardzija
Indentation plastic displacement field: Part II. The case of hard films on soft Substrates T.Y. Tsui, J. Vlassak, W.D. Nix Hard protective overlayers on viscoelastic-plastic Substrates W.W. Gerberich, A. Strojny, K. Yoder, L-S. Cheng
The effect of target crystallography on the growth of Pb(Mg1/3Nb2/3)03 thin films using pulsed laser deposition M.H. Corbett, G. Catalan, R.M. Bowman, J.M. Gregg Evidence for continuous areas of crystalline ß-C3N4 in sputter-deposited thin films A.K.M.S. Chowdhury, D.C. Cameron, M.S.J. Hashmi, J.M. Gregg
Initial stages of yield in nanoindentation J.D. Kiely, K.F. Jarausch, J.E. Houston, P.E. Russell
Measuring the critical thickness of thin metalorganic precursor films
Nanoindentation of a 10-nm-thick thin film T. Sawa, Y. Akiyama, A. Shimamoto, K. Tanaka
R.K. Roeder, E.B. Slamovich
Nanoindentation and incipient plasticity E.B. Tadmor, R. Miller, R. Phillips, M. Ortiz A study of the submicron intent-induced plastic deformation C.F. Robertson, M.C. Fivel Deconvolution of hardness from data obtained from nanoindentation of rough surfaces M.S. Bobji, S.K. Biswas
Energy considerations regarding yield points during indentation D.F. Bahr, D.E. Wilson, D.A. Crowson Compensating for elastic deformation of the indenter in hardness tests of very hard materials R.Y. Lo, D.B. Bogy Using the PS1 analysis to deconvolute the nanoindentation response of hard-coated Systems M.R. McGurk, T.F. Page A critical examination of the fundamental relations used in the analysis of nanoindentation data J.C. Hay, A. Bolshakov, G.M. Pharr Substrate composition effects on the interfacial fracture of tantalum nitride films N.R. Moody, A. Strojny, D.L. Mediin, A. Talin, W.W. Gerberich
Accurate determination of the mechanical properties of thin aluminum films deposited on sapphire flats using nanoindentations Y.Y. Lim, M.M. Chaudhri, Y. Enomoto Micro/nanomechanical and tribological characterization of ultrathin amorphous carbon coatings X. Li, B. Bhushan
Ultra-micro-indentation of Silicon and Compound semiconductors with spherical indenters J.S. Williams, Y. Chen, J. Wong-Leung, A. Kerr, M.V. Swain
Lower crystallization temperature of sol-gel PbTi0 3 on Ti/Pt-coated Substrates R.E. Avila, T.P. Velilla, P.J. Retuert A new method to study cyclic deformation of thin films in tension and compression M. Hommel, O. Kraft, E. Arzt Effect of surface kinetics on the step coverage during chemical vapor deposition G.S. Hwang, S.H. Moon, S.W. Nam, C.B. Shin Synthesis and characteristics of ZnS/CdS composite nanocrystals in block copolymer micelle D. Wang, Y. Cao, X. Zhang, X. Qian, X. Ai, Z. Liu, F. Liu, D. Wang, Y. Bai, T. Li, X. Tang
ARTICLES Epitaxial cerium oxide buffer layers and YBa2Cu3
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