Advanced Computing in Electron Microscopy
Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanni
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Earl J. Kirkland
Advanced Computing in Electron Microscopy Second Edition
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Earl J. Kirkland School of Applied and Engineering Physics Cornell University 212 Clark Hall Ithaca, NY 14853 USA [email protected]
ISBN 978-1-4419-6532-5 e-ISBN 978-1-4419-6533-2 DOI 10.1007/978-1-4419-6533-2 Springer New York Dordrecht Heidelberg London Library of Congress Control Number: 2010931437 c Springer Science+Business Media, LLC 2010 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper Springer is part of Springer Science+Business Media (www.springer.com)
Preface
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The first edition included a CD with computer programs, which is not included in this edition. Instead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/˜kirkland, but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig. 5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig. 7.24. Again, I apologize in advance for leaving out some undoubtedly outstanding references. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009
Preface to First Edition Image simulation has become a common tool in HREM (High Resolution Electron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is difficult for beginners to get started in this field. The principle method of image simulation has come to be known as simply the multislice method. This book attempts to bring the diverse information on image simulation together into one place and to provide a background on how to use the multislice method to simulate high resolution images in both conventional and scanning transmission electron microscopy. The main goals of image simulation include understanding the microscope and interpreting high resolution information in the v
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