Analytical Imaging Techniques for Soft Matter Characterization
This book describes the microscopic characterization of the soft matter in the light of new advances acquired in the science of microscopy techniques like AFM, SEM, TEM etc. The book does not focus on the traditional information on the microscopy methods
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Vikas Mittal Nadejda B. Matsko •
Analytical Imaging Techniques for Soft Matter Characterization
123
Nadejda B. Matsko Institute for Electron Microscopy and Fine Structure Research Technical University of Graz Graz Austria
Vikas Mittal Chemical Engineering Department The Petroleum Institute Room Number 2204 Abu Dhabi UAE
ISSN 1612-1317 ISBN 978-3-642-30399-9 DOI 10.1007/978-3-642-30400-2
ISSN 1868-1212 (electronic) ISBN 978-3-642-30400-2 (eBook)
Springer Heidelberg New York Dordrecht London Library of Congress Control Number: 2012939481 Ó Springer-Verlag Berlin Heidelberg 2012 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Exempted from this legal reservation are brief excerpts in connection with reviews or scholarly analysis or material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Duplication of this publication or parts thereof is permitted only under the provisions of the Copyright Law of the Publisher’s location, in its current version, and permission for use must always be obtained from Springer. Permissions for use may be obtained through RightsLink at the Copyright Clearance Center. Violations are liable to prosecution under the respective Copyright Law. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. While the advice and information in this book are believed to be true and accurate at the date of publication, neither the authors nor the editors nor the publisher can accept any legal responsibility for any errors or omissions that may be made. The publisher makes no warranty, express or implied, with respect to the material contained herein. Printed on acid-free paper Springer is part of Springer Science+Business Media (www.springer.com)
Preface
This book aims to describe the microscopic characterization of the soft matter in the light of new advances acquired in the science of microscopy techniques such as AFM; SEM; TEM, etc. It does not focus on the traditional information on the microscopy methods as well as systems already present in different books, but intends to answer more fundamental questions associated with commercially important systems by using new advances in microscopy. Such questions are generally not answered by other techniques. The contents of this book also reflect this as the chapters are no
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