Atomic Force Microscopy Peter Eaton and Paul West

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Atomic Force Microscopy Peter Eaton and Paul West Oxford University Press, 2010 288 pages, $99.00 ISBN 978-0-19-957045-4


his book can be called a practical introduction to atomic force microscopy (AFM). It is outstanding among those written on this subject. I have worked with AFM starting from the year of its invention, and have seen books written quite formally. This book is written by true experts with a deep knowledge of the AFM technique. In addition, the book is written in a good, succinct manner. With only about 200 pages of text, the book covers the main AFM area (as it was in 2010). It is impossible to describe everything in detail within this page limit. I would therefore call this an introduction. This book can be useful for both beginners and experienced AFMers. The absence of extensive mathematics makes this book somewhat oversimplified. However, this may attract a broader audience of readers. As such, this book can be recommended for undergraduate students and above.

The introduction chapter is followed by a description of the AFM instrumentation, its basic components electronics software, and such. Chapters 2 and 3 describe the basic AFM modes in detail and in a nice logical way. Chapters 4 and 5 describe the procedures of measurements, imaging, processing, and analysis. This is structured as a sort of “super manual.” I wish I had such a useful text when learning this technique. Chapter 6 describes imaging artifacts, which is the Achilles’s heel of AFM. Although the list and description of possible artifacts is quite impressive, it is unrealistic to present a comprehensive description within a book of this size. The last chapter describes several areas of AFM applications. This is the place in which the book could have been expanded considerably. Nevertheless, it is a good and broad sketch of modern applications of the AFM technique.

Reviewer: Igor Sokolov is a professor at Tufts University, Medford, Mass., USA.

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