Calibration of Binding Energy Positions with C1s for XPS Results
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https: //doi. org/10.1007/s11595-020-2312-7
Calibration of Binding Energy Positions with C1s for XPS Results FANG De1,2, HE Feng1,3, XIE Junlin1,2,3*, XUE Lihui2
(1. State Key Laboratory of Silicate Materials for Architectures, Wuhan University of Technology, Wuhan 430070, China; 2. Center for Materials Research and Analysis, Wuhan University of Technology, Wuhan 430070, China; 3. School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, China)
Abstract: The adventitious carbon located at 284.8 eV was used to calibrate samples without the carbon themselves. When the carbon is as a major part of the inorganic material, the adventitious carbon should be identified and used as the reference. There is no adventitious carbon on the surfaces of the polymer materials, so using C1s of the carbon in the polymer itself to calibrate the charging effect is reasonable. Furthermore, compared with gold and argon, a more practical and convenient method based on C1s is proposed to get the right positions for binding energy peaks. Key words: XPS; calibration; charging effect; binding energy; C1s
1 Introduction As a surface analysis technique, X-ray photoelectron spectroscopy(XPS) has been widely used in the scientific researches[1-5], while the most notable of many features for XPS is the surface sensitivity[6-8]. The chemical states and quantitative information for most elements can be identified according to the position and intensity of the XPS peaks. Binding energy databases, such as the NIST database[9] or the Handbooks from Perkin-Elmer and Springer Co [10-12] , can provide sufficient information to analyze the XPS data from the experiments. During the XPS tests, samples may be insulators, semiconductors or conductors from all walks of life. As shown in Fig.1, the charging effect takes place for insulators and semiconductors due to the escape of photoelectrons, but the conductors can obtain lots of electrons from the earth to avoid the charging effect. The charging effect can result in the stable surface potential that decreases the kinetic energy of photoelectrons, while the surface potential is related to © Wuhan University of Technology and Springer-Verlag GmbH Germany, Part of Springer Nature 2020 (Received: Sept. 16, 2019; Accepted: Nov. 7, 2019) FANG De(方德): Assoc. Prof.; Ph D; E-mail: fangde0914@ whut.edu.cn *Corresponding author: XIE Junlin(谢峻林): Prof.; Ph D; E-mail: [email protected] Funded by the National Key R&D Program of China (2017YFC0210802) and the Fundamental Research Funds for the Central Universities (WUT: 2019III015GX)
Fig.1 The charging effect during the XPS tests: (a) Conductors; (b) Insulators and semiconductors
the conducting properties, thickness, surface roughness and X-ray source. Meanwhile, the charging effect leads to the increasing of the binding energy and the changing (widening or distortion) of the curves, having a detrimental effect on the analysis of results [13-18]. Therefore, effective measures should be carried out in practical work to solve the en
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