Conception and Evaluation of Secure Circuits for Strong Digital PUF

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ORIGINAL RESEARCH

Conception and Evaluation of Secure Circuits for Strong Digital PUF Johan Marconot1,2 · David Hely2   · Florian Pebay‑Peyroula1 Received: 4 May 2020 / Accepted: 27 July 2020 © Springer Nature Singapore Pte Ltd 2020

Abstract Physical unclonable functions (PUFs) are efficient primitives to generate authentication signatures and security keys. However, PUFs may be sensitive to noise and environmental conditions inducing reliability issues. Digital PUFs (DPUFs), which are by design inherently robust, have recently been proposed in the literature. They rely on static source of entropy: random structures produced by specific manufacturing process. In this paper, we propose secure efficient circuits to extract responses from these structures and further develop strong DPUF model. We first review the existing DPUF fabrication processes and associate extraction circuits, and discuss possible optimization in terms of cost and security. We notably use substitution–permutation networks (SPN) as a logical scheme to extract the DPUF data. The SPN circuit performances depend not only on network parameters but also by dimension and randomness of DPUF structures. We modelize and evaluate diverse SPN circuit settings providing ideal configurations for security-cost trade-off. Finally, we measure the implementation cost, identifying the most optimized configuration which reduces the circuit area. Our final SPN circuit for strong DPUF model needs less than 12,000 um2 circuit area (for a 45 nm technology node) and diffuseness is estimated to 0.5 ± 0.001. The results make SPN-based strong DPUF a pertinent alternative to classic PUF. Keywords  Physical unclonable function · Digital PUF · Diffuseness · Substitution–permutation network · Implementation cost

Introduction

This article is part of the topical collection “Hardware-Assisted Security Solutions for Electronic Systems” guest edited by Himanshu Thapliyal, Saraju P. Mohanty, Wujie Wen and Yiran Chen. Electronic supplementary material  The online version of this article (https​://doi.org/10.1007/s4297​9-020-00274​-0) contains supplementary material, which is available to authorized users. * David Hely david.hely@grenoble‑inp.fr Johan Marconot Johan.marconot@grenoble‑inp.fr Florian Pebay‑Peyroula [email protected] 1



University of Grenoble Alpes, CEA, LETI, DSYS, Grenoble, France



University of Grenoble Alpes, Grenoble INP, LCIS, 26000 Valence, France

2

Physical unclonable functions (PUF) are being known as a promising way to build efficient authentication mechanisms for integrated circuit (IC). Not reproducible and unpredictable fluctuations of IC manufacturing process ensure for each IC an unclonable physical disorder. A PUF measures a chosen physical parameter (e.g. time [1], frequency [2] …) to extract a unique chip signature. PUFs are based on challenge–response mechanisms which are classified in two categories: strong and weak. A rigorous definition is given in [3]: a PUF is classified as strong if it has a large challenge–response pairs (CRP) spa