Controlled Atmosphere Transmission Electron Microscopy Principles an
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered
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Controlled Atmosphere Transmission Electron Microscopy Principles and Practice
Controlled Atmosphere Transmission Electron Microscopy
Thomas Willum Hansen • Jakob Birkedal Wagner Editors
Controlled Atmosphere Transmission Electron Microscopy Principles and Practice
Editors Thomas Willum Hansen Center for Electron Nanoscopy Technical University of Denmark Kgs. Lyngby, Denmark
Jakob Birkedal Wagner Center for Electron Nanoscopy Technical University of Denmark Kgs. Lyngby, Denmark
ISBN 978-3-319-22987-4 ISBN 978-3-319-22988-1 DOI 10.1007/978-3-319-22988-1
(eBook)
Library of Congress Control Number: 2015951843 Springer Cham Heidelberg New York Dordrecht London © Springer International Publishing Switzerland 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper Springer International Publishing AG Switzerland is part of Springer Science+Business Media (www.springer.com)
Preface
Electron microscopy has long been the de facto standard for materials scientists to obtain structural information that now approaches the atomic scale. Scanning electron microscopy and transmission electron microscopy, along with the many peripherals now available, provide information about three-dimensional structure, particle size and morphology, layer thickness, as well as elemental, chemical, and magnetic information, to name just a few characteristics. Traditionally, electron microscopy has been performed in high vacuum or even ultrahigh vacuum, in order to prevent sample contamination, preserve the performance of the electron source, and maintain coherence of the electron wave. However, for several applications, observing samples under vacuum conditions is far from a realistic scenario when one considers the actual working environment of the material under study. To remedy this situation, the controlled atmosphere microscope was conceived. Using various adaptations either to the sample holder or to the microscope, a certain volume of gas can be maintained aroun
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