Crystallization as Studied by Broadband Dielectric Spectroscopy
This book presents new approaches that offer a better characterization of the interrelationship between crystalline and amorphous phases. In recent years, the use of dielectric spectroscopy has significantly improved our understanding of crystallization.
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Tiberio A. Ezquerra Aurora Nogales Editors
Crystallization as Studied by Broadband Dielectric Spectroscopy
Advances in Dielectrics Series Editor Friedrich Kremer, Fakultät für Physik und Geowissenschaften, Peter-Debye-Institut für Physik der weichen Materie, Universität Leipzig, Leipzig, Germany
Aims and Scope Broadband Dielectric Spectroscopy (BDS) has developed tremendously in the last decade. For dielectric measurements it is now state of the art to cover typically 8–10 decades in frequency and to carry out the experiments in a wide temperature and pressure range. In this way a wealth of fundamental studies in molecular physics became possible, e.g. the scaling of relaxation processes, the interplay between rotational and translational diffusion, charge transport in disordered systems, and molecular dynamics in the geometrical confinement of different dimensionality—to name but a few. BDS has also proven to be an indispensable tool in modern material science; it plays e.g. an essential role in the characterization of Liquid Crystals or Ionic Liquids and the design of low-loss dielectric materials. It is the aim of “Advances in Dielectrics” to reflect this rapid progress with a series of monographs devoted to specialized topics. Target Group Solid state physicists, molecular physicists, material scientists, ferroelectric scientists, soft matter scientists, polymer scientists, electronic and electrical engineers.
More information about this series at http://www.springer.com/series/8283
Tiberio A. Ezquerra Aurora Nogales •
Editors
Crystallization as Studied by Broadband Dielectric Spectroscopy
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Editors Tiberio A. Ezquerra Departamento de Física Macromolecular, Instituto de Estructura de la Materia (IEM) Consejo Superior de Investigaciones Científicas (CSIC) Madrid, Spain
Aurora Nogales Departamento de Física Macromolecular, Instituto de Estructura de la Materia (IEM) Consejo Superior de Investigaciones Científicas (CSIC) Madrid, Spain
ISSN 2190-930X ISSN 2190-9318 (electronic) Advances in Dielectrics ISBN 978-3-030-56185-7 ISBN 978-3-030-56186-4 (eBook) https://doi.org/10.1007/978-3-030-56186-4 © Springer Nature Switzerland AG 2020 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accura
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