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Microbeam and Nanobeam Analysis Edited by D. Benoit, J.-F. Bresse, L. Van't dack, H. Werner, J. Wernisch Mikrochimica Acta Supplement 13

Springer-Verlag Wien GmbH

Dr. Daniele Benoit Beauchamp, France

Dr. Jean-Francois Bresse Department PAP/CDP/CMT, C.N.E.T. France Telecom Bagneux, France

Luc Van't dack Department of Chemistry, University of Antwerp (UlA), Antwerp-Wilrijk, Belgium

Univ.-Prof. Dr. Helmut Wemer Waalre, The Netherlands

Univ.-Doz. Dr. Johann Wemisch Institut fiir angewandte und technische Physik, Technische Universităt, Wien, Austria

This work is subject to copyright. Ali rights are reserved, whether the whole or part of the material is concemed, specifically those of translation, reprinting, re-use of illustrations, broadcasting, reproduction by photocopying machine or similar means, and storage in data banks. © 1996 Springer-Verlag Wien Originally published by Springer-Verlag/Wien in 1996

Product Liability: The publisher can give no guarantee for information about drug dosage and application thereof contained in this book. In every individual case the respective user must check its accuracy by consulting other pharmaceuticalliterature. The use of registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: Thomson Press, New Delhi, India Graphic design: Ecke Bonk Printed on acid-free and chlorine free bleached paper.

With 394 partly coloured Figures

Die Deutsche Bibliothek - CIP-Einheitsaufnahme Microbeam and nanobeam analysis / D. Benoit ... (ed.). - Wien ; New York: Springer, 1996 (Mikrochimica acta : Supplementum ; 13) ISBN 978-3-211-82874-8

ISBN 978-3-7091-6555-3 (eBook)

DOI 10.1007/978-3-7091-6555-3

NE: Benoit, Daniele [Hrsg.]; Mikrochimica acta / Supplementum

ISSN 0026-3672 ISBN 978-3-211-82874-8

Preface This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simulations, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quantities using different techniques: synchrotron radiation X-ray fluorescence, particle induced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim