Electric and Magnetic Phenomena Studied by In Situ Transmission Electron Microscopy
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Magnetic Phenomena Studied by In Situ Transmission Electron Microscopy
gathered about the electric and magnetic fields in and around a device, by virtue of the electric charge carried by the electrons. This review is not meant to be an exhaustive look at the study of electric and magnetic fields in samples. Rather, our mission is to give an overview of the types of studies that have been done and to give a feel for where we as authors see the field going. We first give an overview of the methods of transmission electron microscopy (TEM) for gathering this electromagnetic information, followed by an overview of the specific application of these techniques to the study of magnetic materials and structures. We then move on to an overview of electric devices that have been studied by TEM. Last, we introduce a growing area of work where direct nanoscale manipulation is used to create and study devices in situ during observations. Finally, we give an outlook toward the future of in situ TEM studies of electric and magnetic devices.
John Cumings, Eva Olsson, Amanda K. Petford-Long, and Yimei Zhu
Methods of Obtaining Electric and Magnetic Information Instrumentation
Abstract There is a wide array of technologically significant materials whose response to electric and magnetic fields can make or break their utility for specific applications. Often, these electrical and magnetic properties are determined by nanoscale features that can be most effectively understood through electron microscopy studies. Here, we present an overview of the capabilities for transmission electron microscopy for uncovering information about electric and magnetic properties of materials in the context of operational devices. When devices are operated during microscope observations, a wealth of information is available about dynamics, including metastable and transitional states. Additionally, because the imaging beam is electrically charged, it can directly capture information about the electric and magnetic fields in and around devices of interest. This is perhaps most relevant to the growing areas of nanomaterials and nanodevice research. Several specific examples are presented of materials systems that have been explored with these techniques. We also provide a view of the future directions for research.
Introduction In the development of the light microscope as an instrument of science and technology, much of the credit goes not to the Dutch who invented the device, or Hooke and others, who were among the first to use the tool for scientific research, but rather to Antoni van Leeuwenhoek, who was the first to put living organisms behind its lens.1 In this sense, Leeuwenhoek was the first to practice in situ microscopy in his research and thus establish the microscope as a tool for uncovering the origins and inner workings of life itself. Today, the electron microscope is proving itself a valuable tool in
uncovering the inner workings of electronic devices in a similar way. A large part of the value of in situ investigations is the ability
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