Engineering solar cells based on correlative X-ray microscopy
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Engineering solar cells based on correlative X-ray microscopy Michael Stuckelberger,a) Bradley West, and Tara Nietzold Defect Lab, School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287, USA
Barry Lai and Jörg M. Maser Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
Volker Rose Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA; and Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA
Mariana I. Bertoni Defect Lab, School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287, USA (Received 2 October 2016; accepted 13 March 2017)
In situ and operando measurement techniques combined with nanoscale resolution have proven invaluable in multiple fields of study. We argue that evaluating device performance as well as material behavior by correlative X-ray microscopy with ,100 nm resolution can radically change the approach for optimizing absorbers, interfaces and full devices in solar cell research. In this article, we thoroughly discuss the measurement technique of X-ray beam induced current and point out fundamental differences between measurements of wafer-based silicon and thin-film solar cells. Based on reports of the last years, we showcase the potential that X-ray microscopy measurements have in combination with in situ and operando approaches throughout the solar cell lifecycle: from the growth of individual layers to the performance under operating conditions and degradation mechanisms. Enabled by new developments in synchrotron beamlines, the combination of high spatial resolution with high brilliance and a safe working distance allows for the insertion of measurement equipment that can pave the way for a new class of experiments. Applied to photovoltaics research, we highlight today’s opportunities and challenges in the field of nanoscale X-ray microscopy, and give an outlook on future developments.
I. INTRODUCTION
X-ray microscopy has grown to be a field with innumerable applications in biology, archaeology, medicine, materials research, and others, and an adequate review covering all these fields could fill many books. In this article, we give an overview of recent progress and impending challenges of correlative X-ray microscopy in the field of photovoltaics, limiting ourselves to studies that include: (i) Correlative microscopy, i.e. mapping of multiple parameters with sub-micrometer resolution. (ii) Application to photovoltaic material or device investigation. (iii) Utilization of X-rays generated by synchrotrons, as they are the only X-ray source that can provide brilliant Contributing Editor: Chris Nicklin a) Address all correspondence to this author. e-mail: [email protected] DOI: 10.1557/jmr.2017.108
beams for microscopy (to our knowledge, correlative microscopic photovoltaic research utilizing X-ray free electron lasers or laboratory X-ray sources has not yet been reported). There is a good reason for this limitation: unli
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