Enhancement of Photoelectric Effect in Organic Dye Thin Film Cells by Surface Plasmon Excitation
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Enhancement of Photoelectric Effect in Organic Dye Thin Film Cells by Surface Plasmon Excitation Keizo Kato1, 2, Masaru Hirano3, Kazunari Shinbo1, 2, Futao Kaneko1, 2 and Takashi Wakamatsu4 1 Dept. of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, JAPAN 2 Center for Transdisciplinary Research, Niigata University, Ikarashi 2-8050, Niigata 950-2181, JAPAN 3 Graduate School of Science and Technology, Niigata University, Ikarashi 2-8050, Niigata 950-2181, JAPAN 4 Dept. of Electrical Engineering, Ibaraki National College of Technology, 866 Nakane, Hitachinaka 312-8508, JAPAN ABSTRACT Photoelectric properties have been investigated for the organic dye thin film cells utilizing surface plasmon (SP) excitation. The cells fabricated in this work had a prism/Al thin film/copper phtalocyanine (CuPc) thin film/Ag thin film structure, which was the Kretschmann configuration in the attenuated total reflection (ATR) method. Since the CuPc thin film exhibits p-type conduction, the Schottky and Ohmic contacts can be obtained at the interfaces between the CuPc and Al thin films and between the CuPc and Ag thin films, respectively, and the cells used in this work show photoelectric properties. The ATR and short-circuit photocurrent properties have been simultaneously measured as a function of the incident angles of the laser beams. The experimental and calculated results of the ATR and short-circuit photocurrent properties and the optical absorptions of the organic dye layers were discussed. It was found that the photoelectric effect in the organic dye thin film cells the Kretschmann configuration in the ATR method was enhanced by the SP excitation. INTRODUCTION Recently, organic thin films have been attracting much attention for their variety of functions, such as gas sensing, non-liner optics, luminescence and photoelectric effect. Various studies on the organic thin films have been carried out so far [1, 2]. Several studies of the organic photoelectric devices have been reported [3]. For the conventional photoelectric devices, high efficiency has not been obtained because of light transmission through organic thin layers, light reflection at the metal electrodes in the cells and so on. In the attenuated total reflection (ATR) configuration utilizing the surface plasmon (SP) excitation [4-8], remarkably strong optical absorption is expected for organic dye ultrathin films in photoelectric cells [9-11]. For the development of photoelectric devices with high efficiency, it is important to evaluate the structure and the optical and electrical properties of the devices. The ATR method is one of useful measurements of evaluating ultrathin films. The SP resonance propertiers, that is, ATR curves are measured as a function of the incident angle at a constant wavelength, utilizing the SP resonantly excited at the interface between metal and dielectrics in a configuration of dielectric ultrathin films on metal thin films [4-8]. The complex dielectric constants and/or the thickness of the
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