Formation of Metal Nitrides by Nitrogen Implantation
- PDF / 709,397 Bytes
- 6 Pages / 417.6 x 639 pts Page_size
- 46 Downloads / 278 Views
		    Mat. Res. Soc. Symp. Proc. Vol. 54,
 
 1986 Materials Research Society
 
 618
 
 identify the phases present in the thin film samples. RESULTS Two typical X-ray diffraction spectra are shown in Figures I and 2, which provide clear and definite evidence of the formation of metal nitrides. Most of the nitrides observed started to appear at implantation doses of the order of 1017 ions/cm2 . The thin metal films implanted to high doses were almost completely converted to their corresponding nitrides as revealed by the absence of the diffraction lines of the matrix metals. A summary of all the metal nitrides obtained in this study is given in Table I. Also listed in it are other nitrides not observed and those obtained by ion implantation as reported in literature. Many equilibrium nitrides did form by room temperature nitrogen implantation, while others were not observed even at very high doses. Table I. Nitride Formation by Nitrogen Implantation in 10 Selected Metals
 
 Ti
 
 Nitrides obtained
 
 Nitrides not obtained
 
 TiN
 
 Ti 2 N
 
 Zr
 
 ZrN
 
 Al
 
 AlN
 
 Nb
 
 Nb2N and NbN(fcc)
 
 Nitrides in literature* TiN
 
 ZrN AIN Conflicting results, NbN or amorphous Cu3 N is unstable and has ordered structure, unfavoured.
 
 Cu 3N
 
 Cu
 
 W
 
 W2 N and WN
 
 Co
 
 Co 3 N
 
 Structural transition needed for Ti 2 N is unfavoured.
 
 Amorphous, tentative Co 2 N, CoN and Co4N
 
 Co4 N, tentative Unfavourable structural transition for both Co2 N and CoN, Co4 N probably unstable
 
 Ni
 
 Ni 3 N
 
 Gd
 
 GdN
 
 Sn
 
 Ni 4 N S
 
 N34
 
 Ni3 N
 
 Ni 4 N probably unstable Sn 3 N4 unstable and structural transition unfavoured
 
 *See Ref. 6 and references therein. It should be pointed out that in the X-ray spectra of the high dose implanted samples many of the nitride peaks appear at a d-value(planar spacing) This may be attrilarger than the standard value given by the ASTM cards. buted to nitrogen supersaturation and/or the presence of elastic stresses. A medium temperature annealing of these as-implanted nitrides indeed caused relaxation of the structure to approach the standard spacing values.
 
 619
 
 4
 
 F 1
 
 F.I.X-ray spectrum far bulk Ti inplanted by N+ to a dose of 5X10
 
 17
 
 2
 
 /an .
 
 0
 
 F. 0 o5
 
 0 0
 
 C
 
 60
 
 )5
 
 50
 
 45
 
 40
 
 55
 
 26 Fig. 2.
 
 X-ray spectrum for Ni film ( _1000R) inplanted by N+ to a dose of 17 2 5X10 /an
 
 DISCUSSION
 
 There have been much discussion concerning the ion beam induced phase transformation, especially from crystalline to metastable state or vice versa. Some empirical criteria are advanced to predict the amorphization induced by ion beam [5], emphasizing either on the solubility range of the compound (Brimhall et al. ), structural and kinetic consideration (Liu et al. and Hung et al. ), the heat of formation (Alonso et al. ) or polymorphic transition (Johnson et al. ). In a general discussion of metalloid implantation into metals, Rausenbach and Hohmuth [6] proposed a criterion based on Hagg's rule stating that amorphization will occur in systems where R (the ratio of the radius of the metalloid atwi to that of the metal atom) is larger than 0.59. As far as the nitrog		
Data Loading...
 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	