Gallium Nitride Electronics
Gallium Nitride Electronics covers developments in III-N semiconductor-based electronics with a focus on high-power and high-speed RF applications. Material properties of III-N semiconductors and substrates; the state-of-the-art of devices and circuits, e
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materials science
Springer Series in
materials science Editors:
R. Hull
R. M. Osgood, Jr.
J. Parisi
H. Warlimont
The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials. Self-Organized Morphology in Nanostructured Materials Editors: K. Al-Shamery and J. Parisi Self Healing Materials An Alternative Approach to Centuries of Materials Science Editor: S. van der Zwaag New Organic Nanostructures for Next Generation Devices Editors: K. Al-Shamery, H.-G. Rubahn, and H. Sitter Photonic Crystal Fibers Properties and Applications By F. Poli, A. Cucinotta, and S. Selleri Polarons in Advanced Materials Editor: A.S. Alexandrov Transparent Conductive Zinc Oxide Basics and Applications in Thin Film Solar Cells Editors: K. Ellmer, A. Klein, and B. Rech
Volumes – are listed at the end of the book.
Dilute III-V Nitride Semiconductors and Material Systems Physics and Technology Editor: A. Erol Into The Nano Era Moore’s Law Beyond Planar Silicon CMOS Editor: H.R. Huff Organic Semiconductors in Sensor Applications Editors: D.A. Bernards, R.M. Ownes, and G.G. Malliaras Evolution of Thin-Film Morphology Modeling and Simulations By M. Pelliccione and T.-M. Lu Reactive Sputter Deposition Editors: D. Depla amd S. Mahieu The Physics of Organic Superconductors and Conductors Editor: A. Lebed
Rüdiger Quay
Gallium Nitride Electronics
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Dr. Rüdiger Quay Fraunhofer Institut für Angewandte Festkörperphysik (IAF) Tullastr. , , Freiburg, Germany Series Editors: Professor Robert Hull University of Virginia Dept. of Materials Science and Engineering Thornton Hall Charlottesville, VA -, USA
Professor Jürgen Parisi Universität Oldenburg, Fachbereich Physik Abt. Energie- und Halbleiterforschung Carl-von-Ossietzky-Strasse – Oldenburg, Germany
Professor R. M. Osgood, Jr. Microelectronics Science Laboratory Department of Electrical Engineering Columbia University Seeley W. Mudd Building New York, NY , USA
Professor Hans Warlimont Institut für Festkörperund Werkstofforschung, Helmholtzstrasse Dresden, Germany
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DOI ./---- Springer Series in Materials Sciences ISSN -X Library of Congress Control Number: © Springer-Verlag Berlin Heidelberg This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only unde
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