Identification of Logic Paths Influenced by Severe Coupling Capacitances
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Identification of Logic Paths Influenced by Severe Coupling Capacitances I. D. Meza-Ibarra1 · V. Champac2 · R. Gomez-Fuentes1
· J. R. Noriega1 · A. Vera-Marquina1
Received: 22 July 2020 / Accepted: 2 November 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020
Abstract Signals in modern integrated circuits travel through complex interconnect structures, which present several layers and important coupling capacitance effects. Even more, the impact of signal coupling on the overall circuit behavior has grown with technology scaling as the interconnect have become taller. In this paper, a methodology to identify those logic paths more significantly influenced by the coupling capacitances is presented. The proposed methodology is based on a modified Dijkstra’s algorithm, which finds those paths between a primary input and a primary output more severely influenced by the coupling capacitances. This methodology can be used to validate circuit behavior and it can also be applied in testing techniques oriented to detect interconnect defects (e.g., opens and short defects). The proposed methodology is applied to ISCAS’85 benchmark circuits to show its feasibility. Keywords Dijkstra’s algorithm · Coupling capacitances · Logic paths · ISCAS’85 circuits · Interconnection lines
1 Introduction Technological advances have made possible the manufacturing of ever-smaller transistors, resulting in circuit with higher integration density and higher circuit complexity running at high speeds. The scaling down of the dimensions of the devices has led to interconnection lines with closer proximity between them and higher density. As a Responsible Editor: L. M. Bolzhani Poehls R. Gomez-Fuentes
[email protected] I. D. Meza-Ibarra [email protected] V. Champac [email protected] J. R. Noriega [email protected] A. Vera-Marquina [email protected] 1
Departamento de Investigaci´on en F´ısica, Universidad de Sonora, Hermosillo, M´exico
2
National Institute for Astrophysics, Optics and Electronics, Puebla, M´exico
consequence, the switching activity in an interconnect may affect the signal performance in other closer interconnect lines. The impact of the capacitive coupling depends on the amount of coupled capacitance, among others. The coupling interaction between interconnection lines is also known as crosstalk, which can impact the performance, test and reliability of modern integrated circuits. The influence of coupling capacitances increases in scaled technologies. Glitches are undesirable effects that can be caused by crosstalk [5, 21, 29]. A signal transition in an adjacent line perturbing a quiet line may lead to glitches that impact the circuit performance. As a consequence, the gate driven by the perturbed signal may suffer a false switching leading to a circuit logic failure. Even more, a circuit logic failure may not occur, but crosstalk may affect the propagation delay [23]. For instance, crosstalk slows down a signal transition when another signal in an adjacent line makes a transition
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