In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of or
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H11.3.1/L12.3.1
In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems Jean Manca1,2, Ludwig Goris1, Els Kesters1, Laurence Lutsen1,2, Tom Martens1, Ken Haenen1, Milos Nesladek1, Ornella Sanna3, Dirk Vanderzande1,2, Jan D'Haen1,2 and Luc De Schepper1,2 1 Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium 2 IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium 3 University of Cagliari, Piazza d’Armi, I-09123 Cagliari, Italy ABSTRACT In order to tailor the synthesis of new robust organic materials for electronic applications and to guarantee the required life time for the emerging commercial plastic electronic applications it is of key importance to understand the underlying degradation mechanisms. Since plastic electronics is a rather young technology introducing new material systems, its reliability is characterized by new failure and degradation mechanisms, a relatively high amount of early failures and multi-modal failure distributions. To understand the mechanism responsible for a given failure or degradation mode, it is essential to study it separately, through appropriate test structures and test techniques. Powerful techniques for this purpose are a.o. analytical techniques (SEM, TEM, SPM,..), in-situ electrical measurement techniques and spectroscopical techniques (in-situ FTIR, in-situ UV-Vis, PDS). The benefits of these in-situ techniques in the reliability study of organic based electronics will be illustrated in this contribution.
INTRODUCTION The two main challenges for organic based electronic material systems remain : (1) the increase of performance and (2) the increase of stability when used in semiconductor applications. Due to the effective introduction of organic based electronic applications on the consumer market, the stability issue received the recent years an enormous increase in attention. In classical electronic applications, the issue of stability is addressed mainly in the end phase of the development process and various standard tests are available to evaluate the reliability of the new devices and to predict their lifetime. Since plastic electronics is a very young technology, 'cook book' accelerated tests with corresponding life time prediction models are far from being available. Characteristic difficulties for a young technology such as plastic electronics are the occurrence of many new failure and degradation mechanisms, a relatively high amount of early failures and multi-modal failure distributions. A first step in the strategy to improve the reliability is to identify the individual failure and degradation modes. Analytical techniques (SEM, TEM, SPM,..) are often required to determine the failure mode, degree of degradation and nature of morphological changes. In order to understand the underlying mechanism responsible for a given failure or degradation mode, it is essential to study it separately, thr
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