International Field Emission Society Becomes MRS Affiliated Organization
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International Field Emission Society Becomes MRS Affiliated Organization The International Field Emission Society (IFES), a professional association established to promote progress in the science, éducation, and technological application of field émission and related phenomena, has been accepted as a member of the Materials Research Society's Affiliated Organization Program. The Program was established in 1989 to initiate and recognize coopérative interactions with other organizations concerned with materials research (see the August 1989 MRS Bulletin, p. 52). IFES hoïds annual international symposia dealing with ail topics related to the theory and application of field électron émission; field ion émission; field électron microscopy; field ion microscopy; électron, ion, and liquid-metal sources; field ion mass spectrometry; and atom probe microanalysis. Symposium proceedings, previously published in the Colloquium Séries of Journal de Physique, are now available through the journal Surface Science. A second and increasingly important IFES activity is the collection and dissémination of bibliographie information on field émission topics. Printed bibliographies are available for field ion microscopy and related techniques (1951-1978), atom probe microanalysis (1978-1987), field ion microscopy (1988), field élection microscopy (1989), and focused ion beam technology (1955-1990). Work is also progressing on a comprehensive bibliography of field élection émission phenomena. An extended version of the focused ion beam bibliography, including subject keyboarding, is available on computer disk. Other bibliographies may be available in this form in one or two years. This year, the 38th International Field Emission Symposium will take place at the Hôtel Château Wilhelminenberg in Vienna, Austria, August 5-9. Contributions are solicited in the areas of field électron microscopy, field ion microscopy, scanning tunneling microscopy, field ionization
38th International Field Emission Symposium International Field Emission Society Hôtel Château Wihelminenberg, Vienna, Austria, August 5-9,1991 This symposium will deal with ail topics related to the theory and application of field émission, field ionization, and field desorption. Spécial emphasis will be placed on investigations on field électron émission and transport phenomena in solids relating to vacuum microelectronic devices. Contributions are solicited in the areas of: • Field électron microscopy • Field ion microscopy • Scanning tunneling microscopy • Field ionization mass spectrometry • Atom probe microanalysis • Ion and liquid-metal sources The deadline for abstracts is May 1, 1991. For further information about the meeting and submission of papers, contact: Dr. Johannes Mitterauer, Symposium Chairman 38th IFES Institut fur Allgemeine Elektroteknik und Electronik Technische Universitàt Wien Gusshausstrasse 27-29 A-1040 Wien, Austria Phone: 43-222-58801-3870 Fax: 43-222-505-2666 Télex: 131000 tvfaw a E-mail: [email protected]
mass spectrometry, atom probe microanalys
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