Magnetic Resonance of Semiconductors and Their Nanostructures Basic
This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-r
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Pavel G. Baranov Hans Jürgen von Bardeleben Fedor Jelezko Jörg Wrachtrup
Magnetic Resonance of Semiconductors and Their Nanostructures Basic and Advanced Applications
Springer Series in Materials Science Volume 253
Series editors Robert Hull, Charlottesville, USA Chennupati Jagadish, Canberra, Australia Yoshiyuki Kawazoe, Sendai, Japan Richard M. Osgood, New York, USA Jürgen Parisi, Oldenburg, Germany Tae-Yeon Seong, Seoul, Republic of Korea (South Korea) Shin-ichi Uchida, Tokyo, Japan Zhiming M. Wang, Chengdu, China
The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials.
More information about this series at http://www.springer.com/series/856
Pavel G. Baranov Hans Jürgen von Bardeleben Fedor Jelezko Jörg Wrachtrup •
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Magnetic Resonance of Semiconductors and Their Nanostructures Basic and Advanced Applications
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Pavel G. Baranov Laboratory of Microwave Spectroscopy of Crystals Ioffe Institute St. Petersburg Russia Hans Jürgen von Bardeleben Institut des Nanosciences de Paris-INSP Université Pierre et Marie Curie and UMR 7588 au CNRS Paris France
Fedor Jelezko Institut für Quantenoptik Universität Ulm Ulm, Baden-Württemberg Germany Jörg Wrachtrup Physikalisches Institut Universität Stuttgart Stuttgart Germany
ISSN 0933-033X ISSN 2196-2812 (electronic) Springer Series in Materials Science ISBN 978-3-7091-1156-7 ISBN 978-3-7091-1157-4 (eBook) DOI 10.1007/978-3-7091-1157-4 Library of Congress Control Number: 2017932426 © Springer-Verlag GmbH Austria 2017 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutio
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