Meet our Authors
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tton Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada; tel. 905-525-9140, ext. 24767; and email [email protected]. Botton joined the Department of Materials Science and Engineering at McMaster University in 2001. He is currently a professor at McMaster University and scientific director of the Canadian Centre for Electron Microscopy. After earning his PhD degree in materials engineering at Ecole Polytechnique in Montreal, he was a research associate in the Department of Materials Science and Metallurgy at Cambridge University and then a research scientist at the Materials Technology Laboratory of Natural Resources Canada in Ottawa. He holds the Tier 1 Canada Research Chair in Electron Microscopy of Nanoscale Materials. Adrian J. D’Alfonso School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia; and email [email protected]. D’Alfonso is a postdoctoral research fellow in the Theoretical Condensed Matter Physics Group at the University of Melbourne. He obtained a PhD degree in theoretical physics from the University of Melbourne in 2010 on the topic of atomic resolution imaging in two and three dimensions. He was awarded both the FEI CowleyMoodie Award of the Australian Microscopy and Microanalysis Society and the 2011 Bragg Gold Medal of the Australian Institute of Physics for this work. Bert Freitag FEI Company, The Netherlands; and email [email protected]. Freitag works at FEI Company, The Netherlands. He obtained his PhD degree in experimental physics from the University of Cologne (Germany) in 1995. He was a postdoctoral researcher in the Institute for Inorganic Chemistry in Bonn (Germany) before joining FEI in 2000 as an application specialist for material science TEM research. During his time at FEI his role has changed to product manager for Cs-corrected and monochromated S/TEM products and to marketing manager for the entire high-end TEM research market served by the Titan platform. F. Javier García de Abajo IQFR-CSIC, Serrano 119, 28006 Madrid, Spain; tel. 34-653-700-342; and email [email protected]. García de Abajo is currently a research professor at the Spanish CSIC. He received his PhD degree from the University of the Basque Country in 1993. He also was a research fellow at Lawrence Berkeley National Laboratory. García de Abajo is a fellow of the American Physical Society and the Optical Society of America. His main interests lie in electron microscopy and plasmonics.
DOI: 10.1557/mrs.2011.338
© 2012 Materials Research Society
MRS BULLETIN • VOLUME 37 • JANUARY 2012 • www.mrs.org/bulletin
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MEET OUR AUTHORS Jaume Gazquez Institut de Ciència de Materials de Barcelona ICMAB-CSIC, Campus de la UAB, 08193 Bellaterra, Spain; tel. 34-935801853; and email [email protected]. Gazquez has been a researcher in the Department of Superconducting Materials and Large Scale Nanostructuration at the Institute of Materials Science of Barcelona (ICMAB), Spain, since September 2010. He received his PhD degree in physics from Universitat
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