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research interests include electron microscopy of low-dimensional materials, electron irradiation, phase transformations, as well as nucleation phenomena. Peter A. Crozier School for Engineering of Matter, Transport and Energy, Arizona State University, USA; tel. 480 965 2934; and email [email protected]. Crozier is an associate professor in the School for Engineering of Matter, Transport and Energy at Arizona State University (ASU). He obtained BS and PhD degrees in physics from the University of Glasgow with specialization in electron microscopy. He was Director of the Industrial Associates Program at ASU and worked with many petrochemical companies on characterization problems of industrial catalysts. He has 15 years of experience in developing and applying environmental transmission electron microscopy to problems in catalytic materials. In 2011, he was elected a Fellow of the Microscopy Society of America. Thomas W. Hansen Center for Electron Nanoscopy, Technical University of Denmark, Denmark; email [email protected]. Hansen is a senior researcher at the Center for Electron Nanoscopy (Cen) at the Technical University of Denmark (DTU). He received his MSc degree from the University of Copenhagen in 2001 and his PhD degree from DTU in collaboration with Haldor Topsoe A/S in 2006. From 2005–2008, he was a postdoc at the Fritz Haber Institute of the Max Planck Society before joining DTU Cen. His current research interests include understanding the fundamentals of nanoparticles, specifically for use in catalysis primarily using electron microscopy. Jacob Jokisaari Department of Materials Science and Engineering, University of Michigan, USA; email [email protected]. Jokisaari is pursuing a PhD degree at the University of Michigan under Xiaoqing Pan. He received his BS degree in metallurgy from the University of Idaho and a MS degree in materials science from Clemson University in South Carolina. His research focuses on the development and application of in situ transmission electron microscopy methods and systems, coupled with scanning probe microscopy methods to relate electronic properties and structure on the nanoscale. Thomas LaGrange Integrated Dynamic Electron Solutions, Inc., CA, USA; email [email protected]. LaGrange is the Chief Technology Officer at Integrated Dynamic Electron Solutions, Inc. He is a materials scientist with an extensive background in electron microscopy technique and instrumentation development and laser science and hardware development. He received a bachelor’s degree in mechanical engineering and a master’s degree in materials science at Michigan State University, and a PhD degree in applied physics at École Polytechnique Fédérale de Lausanne, Switzerland. He joined Lawrence Livermore National Laboratory as a postdoc in 2005, and later as a staff scientist, where he co-developed the dynamic transmission electron microscope and was PI of the Movie Mode DTEM instrumentation development effort.
DOI: 10.1557/mrs.2014.308
© 2015 Materials Research Society
MRS BULLETIN • VOLUME 40 • JANUARY 201
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