MRS reports election results for 2015
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MRS reports election results for 2015 www.mrs.org/governance
M
embers of the Materials Research Society have elected a vice president (who will serve as president in 2016) and five directors to join the 2015 MRS Board of Directors. The Board is composed of the officers and 12 to 21 directors, established by Board resolution. The officers of the Society are the president (who serves as chair of the Board), the vice president (who is also the president-elect), the secretary, the treas-urer (a position appointed by the Board of Directors), and the immediate past president. Terms of office expire at the end of the year indicated in parentheses. The asterisk (*) designates those who are newly elected. The annual election ended September 19, 2014. The Board of Directors is organized into the following governing committees: Audit, External Relations, Finance, Governance, Nominating, Operational Oversight, and Planning. Chairs and Members of the committees are either designated by policy or are appointed by the president.
David Cahen (2015)
2015 MRS Officers
Weizmann Institute of Science
President Oliver Kraft
Stephen J. Eglash (2015)
Karlsruhe Institute of Technology
Stanford University
Immediate Past President Tia Benson Tolle
Sossina M. Haile (2015) California Institute of Technology
The Boeing Company
Andrea M. Hodge (2015) University of Southern California
Vice President (President-Elect) *Kristi Anseth
Hideo Hosono (2016) Tokyo Institute of Technology
University of Colorado Boulder
Secretary Sean J. Hearne
* Karen L. Kavanagh (2017) Simon Fraser University
Sandia National Laboratories
Treasurer Michael R. Fitzsimmons
Fiona C. Meldrum (2015) University of Leeds
Los Alamos National Laboratory
Kornelius Nielsch (2016) University of Hamburg
Executive Director Todd M. Osman
* Christine Ortiz (2017) Massachusetts Institute of Technology
Materials Research Society
* Sabrina Sartori (2017) University of Oslo
2015 Board of Directors *Charles T. Black (2017)
Eric A. Stach (2015) Brookhaven National Laboratory
Brookhaven National Laboratory
Alexandra Boltasseva (2016)
Loucas Tsakalakos (2016) General Electric–Global Research Center
Purdue University
C. Jeffrey Brinker (2016) Sandia National Laboratories and University of New Mexico
* Anke Weidenkaff (2017) University of Stuttgart
19th International Conference on Microscopy of Semiconducting Materials http://msm2015.iopconfs.org
T
he Institute of Physics (IoP) biannual conference series “Microscopy of Semiconducting Materials” (MSMXIX) will be held March 29–April 2, 2015, at Murray Edwards College, University of Cambridge, UK. The conference has a long tradition of focusing on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important micro-characterization techniques,
including scanning probe microscopy and x-ray topography and diffraction, will also be featured. Devel
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