NanoCT: Visualizing of internal 3D-Structures with Submicrometer Resolution
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NanoCT: Visualizing of internal 3D-Structures with Submicrometer Resolution Oliver Brunke1, Dirk Neuber2, and David K. Lehmann3 1 Application, phoenix|x-ray, Niels-Bohr-Str. 7, Wunstorf, 30655, Germany 2 phoenix|x-ray, Wunstorf, 30655, Germany 3 phoenix|x-ray, St. Petersburg, FL, 33701
ABSTRACT High-resolution Computed Tomography (CT) widely expands the spectrum of detectable internal micro-structures. The new nanotom CT system allows the analysis of samples with the exceptional voxel-resolution of less than 0.5 microns per volume pixel (voxel). Thus internal detail related to a variation in material, density or porosity can be visualised and precisely measured. This opens a new dimension of 3D-microanalysis and will partially substitute traditional destructive methods in industrial quality control and research. The nanotomÆ is the first 180 kV nanoCT system world-wide which is tailored specifically to the highest-resolution applications in material science, micro electronics, geology and biology. Therefore it is particularly suitable for nanoCT-examinations of material samples of any type like synthetic materials, ceramics, composite materials, mineral and organic samples. Several results of high-resolution nanoCT demonstrate the capability to analyse the 3Dmicrostructure of materials with only minimal sample preparation. For instance, it is possible to image different metal phases in solder joints, the texture of fibres in composites or the volume and distribution of voids in castings. The volume data set is visualised by slices or compiled in a three-dimensional view which can be displayed in various ways. By means of volume visualisation software, the threedimensional structure of the reconstructed volume can be easily analysed for pores, cracks, and materials density and distribution with the highest magnification and image quality available. By granting the user the ability to navigate the internal structure of an object slice-byslice with highest resolution in a non-destructive manner, the nanotom creates new possibilities for analysis which have so far been unreachable.
INTRODUCTION For many years, the only way to determine the interior structure of a sample with resolution in the sub-micron range was to section the part. Not only was this technique timeconsuming, but in this destructive process a valuable sample was lost. With advances in x-ray technology, however, this is no longer necessary. In the fields of biology, geology, and engineering, nanoCT allows the researcher to explore a sampleís structures into the sub-micron level as never before (see e.g. [1, 2]).
Before nanoCT could be realized, there were two major obstacles to overcome. First, computers capable of processing large amounts of data in a reasonable amount of time were necessary, and until recently they were cost prohibitive. Second, and more important, an extremely high resolution x-ray system was needed; this included both a tube with a sub-micron focal spot that was powerful enough to penetrate dense samples and a high-r
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