Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Micro
This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single
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Arief Suriadi Budiman
Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction
SpringerBriefs in Applied Sciences and Technology
More information about this series at http://www.springer.com/series/8884
Arief Suriadi Budiman
Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction
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Arief Suriadi Budiman Singapore University of Technology and Design Singapore Singapore
ISSN 2191-530X ISSN 2191-5318 (electronic) SpringerBriefs in Applied Sciences and Technology ISBN 978-981-287-334-7 ISBN 978-981-287-335-4 (eBook) DOI 10.1007/978-981-287-335-4 Library of Congress Control Number: 2014957300 Springer Singapore Heidelberg New York Dordrecht London © The Author(s) 2015 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper Springer Science+Business Media Singapore Pte Ltd. is part of Springer Science+Business Media (www.springer.com)
Acknowledgments
When I finally decided in April 2002 to become a mid-career student in a Ph.D. program at Stanford University—from which this book is originated—little did I know the insurmountable emotional “mountain” that I was about to have to move. But the Good Book was right. “If you just have faith as small as a mustard seed, nothing will be impossible” (Matthew 17:20). If I am standing where I am right now, that is only by that faith—no matter how very small it might have felt at times during these past five years—and with the help and sacrifice of many people around me. I would first and foremost like to thank my former Ph.D. advisor at Stanford, Professor William D. Nix. I remember speaking to him on the phone for the very first time in Spring 2001 to discuss financial support to enable me to come to Stanford. Even in that first conversation, I was already struck by his warmth, passion and kind encouragements, even though he barely knew me at the time. I realize now how calling his office that afternoon was indeed a stroke of luck in my lifetime. He has certainly been
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