Reciprocal-Lattice Space Imaging of X-Ray Intensities Diffracted from Nanowires
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RECIPROCAL-LATTICE SPACE IMAGING OF X-RAY INTENSITIES DIFFRACTED FROM NANOWIRES Osami Sakata1, Akiko Kitano1, Wataru Yashiro2, Kunihiro Sakamoto3, Kazushi Miki2, Akifumi Matsuda4, Wakana Hara4, Shusaku Akiba4, and Mamoru Yoshimoto4 1
Materials Science Division, Japan Synchrotron Radiation Research Institute (JASRI) / SPring-8, 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5198, Japan 2 Nanomaterials Laboratory, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba Sengen, Ibaraki, 305-8568, Japan 3 Nanoelectronics Research Institute (NeRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan 4 Materials & Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8503, Japan ABSTRACT A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 x n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires. INTRODUCTION Structural investigation is essential for development of nanotechnological materials such as nanoelectronics and nanophotonics. A nanowire structure is particularly interesting since the wire will be one of the minimum parts of microelectrical devices. X-ray diffraction is a promising nondestructive method for determining atomic-scale structures. X-ray scattering/diffraction techniques have revealed surface / interface structures. In particular, the conventional x-ray surface-diffraction approach through maps x-ray intensities diffracted / scattered around Bragg conditions in a reciprocal-lattice space, resulting in determination of a sub-angstrom-scale structure. While being suitable for refining such a structure model, it takes much time. It would be informative quickly to screen samples before this approach. In addition, quick characterization of the surface / interface structures could be demanded from an engineering point of view for device development. In the present study, to establish a rapid structural characterization method, we have developed an "obvious-at-a-glance” analysis or “min-exposure” one using reciprocal-lattice space imaging. Sheet-shape diffraction emanating from ultrathin NiO nanowires and Si-sandwiched Bi atomic wires provided us with their crystallographic or structural information. EXPERIMENTAL Concept Figure 1 shows typical geometries of the reciprocal-lattice space imaging method. The
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Figure 1. Geometry of the reciprocal-lattice space imaging method for crystalline wires almost parallel to incident x rays (A) and perpendicular to the x rays (B). basic idea of the technique is to use sheet-shape or extended diffraction conditions of a 1 D cr
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