Rodlike nanoparticle parameter measurement method based on improved Mask R-CNN segmentation

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ORIGINAL PAPER

Rodlike nanoparticle parameter measurement method based on improved Mask R-CNN segmentation Fang Zhang1,3 · Dongxu Zhao1,3 · Zhitao Xiao1,3 · Jun Wu2,3 · Lei Geng1,3 · Wen Wang1,3 · Yanbei Liu1,3 Received: 4 December 2019 / Revised: 26 July 2020 / Accepted: 7 September 2020 © Springer-Verlag London Ltd., part of Springer Nature 2020

Abstract Parameter measurement of nanoparticle, which aims at evaluation of the quality of nanomaterials, is essential to nanotechnology and many applications. According to the nanoparticle images captured by transmission electron microscopy, this paper presents an automated procedure that can expedite the parameter measurement of the rodlike nanoparticles. Nanoparticle segmentation is the most important step in nanoparticle parameter measurement. The challenge of this task involves segmenting the adhesive nanoparticles and nanoparticles with weak contours. To accurately measure nanoparticle size and evaluate nanomaterial quality, firstly, according to the characteristics of agglomeration and adhesion of nanoparticle images, the Mask R-CNN network was selected to segment the nanoparticle images, and the network was optimized to improve the segmentation accuracy. Secondly, according to the particle segmentation result, the minimum circumscribed rectangle of the rodlike nanoparticle boundary is obtained. Finally, the size and shape parameters of the particles are measured based on the minimum circumscribed rectangle. The experimental results confirm the effectiveness of the proposed method for measuring the rodlike nanoparticle parameters. Keywords Rodlike nanoparticles · Parameter measurement · Mask R-CNN segmentation · Minimum circumscribed rectangle

1 Introduction Nanotechnology is widely applied in the fields of catalytic science, biomedicine, electric power and composite materials [1]. Since many properties of nanomaterials have important relationships with the size and morphology of the nanoparticles, the characterization of nanoparticles has an important role in understanding the properties of nanomaterials, seeking applications in nanomaterials, and promoting the development of nanomaterials. Nanoparticle size measurement is a key technology in nanomaterial microstructure characterization. Existing techniques for measuring the size of nanoparticles include the dynamic light scattering method, the X-ray diffraction line width method, the X-ray

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Zhitao Xiao [email protected]

1

School of Life Sciences, Tiangong University, Tianjin 300387, China

2

School of Electronics and Information Engineering, Tiangong University, Tianjin 300387, China

3

Tianjin Key Laboratory of Optoelectronic Detection Technology and System, Tianjin 300387, China

small-angle scattering method and the transmission electron microscope (TEM) method. Among those methods, the TEM method, which enables the observation of the size distribution and shape of nanoparticles, has shown to be reliable. The spherical and rodlike nanoparticles images taken by TEM are shown in Fig. 1a and b. Mat