Static Analysis 22nd International Symposium, SAS 2015, Saint-Malo,

This book constitutes the refereed proceedings of the 22nd International Static Analysis Symposium, SAS 2015, held in Saint-Malo, France, in September 2015. The 18 papers presented in this volume were carefully reviewed and selected from 44 submissions. A

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Sandrine Blazy Thomas Jensen (Eds.)

Static Analysis 22nd International Symposium, SAS 2015 Saint-Malo, France, September 9–11, 2015 Proceedings

123

Lecture Notes in Computer Science

9291

Commenced Publication in 1973 Founding and Former Series Editors: Gerhard Goos, Juris Hartmanis, and Jan van Leeuwen

Editorial Board David Hutchison, UK Josef Kittler, UK John C. Mitchell, USA Bernhard Steffen, Germany Demetri Terzopoulos, USA Gerhard Weikum, Germany

Takeo Kanade, USA Jon M. Kleinberg, USA Friedemann Mattern, Switzerland Moni Naor, Israel C. Pandu Rangan, India Doug Tygar, USA

Advanced Research in Computing and Software Science Subline of Lecture Notes in Computer Science Subline Series Editors Giorgio Ausiello, University of Rome ‘La Sapienza’, Italy Vladimiro Sassone, University of Southampton, UK

Subline Advisory Board Susanne Albers, TU Munich, Germany Benjamin C. Pierce, University of Pennsylvania, USA Bernhard Steffen, University of Dortmund, Germany Deng Xiaotie, City University of Hong Kong Jeannette M.Wing, Microsoft Research, Redmond, WA, USA

More information about this series at http://www.springer.com/series/7407

Sandrine Blazy Thomas Jensen (Eds.) •

Static Analysis 22nd International Symposium, SAS 2015 Saint-Malo, France, September 9–11, 2015 Proceedings

123

Editors Sandrine Blazy Université Rennes 1 Rennes France

Thomas Jensen Inria Rennes France

ISSN 0302-9743 ISSN 1611-3349 (electronic) Lecture Notes in Computer Science ISBN 978-3-662-48287-2 ISBN 978-3-662-48288-9 (eBook) DOI 10.1007/978-3-662-48288-9 Library of Congress Control Number: 2015946743 LNCS Sublibrary: SL1 – Theoretical Computer Science and General Issues Springer Heidelberg New York Dordrecht London © Springer-Verlag Berlin Heidelberg 2015 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper Springer-Verlag GmbH Berlin Heidelberg is part of Springer Science+Business Media (www.springer.com)

Preface

Static Analysis is increasingly recognized as a