The Goodness and Kindhood of Artefacts
One of the peculiar features of our discourse with respect to technical artefacts is its richly evaluative and normative character. We speak routinely of good alarm clocks and poor corkscrews and of functioning mobile phones and malfunctioning TV sets. El
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Philosophy of Engineering and Technology VOLUME 9
Editor-in-chief Pieter Vermaas, Delft University of Technology, the Netherlands. Editors David E. Goldberg, University of Illinois at Urbana-Champaign, USA. Evan Selinger, Rochester Institute of Technology, USA. Ibo van de Poel, Delft University of Technology, the Netherlands. Editorial advisory board Philip Brey, Twente University, the Netherlands. Louis Bucciarelli, Massachusetts Institute of Technology, U.S.A. Michael Davis, Illinois Institute of Technology, U.S.A. Paul Durbin, University of Delaware, U.S.A. Andrew Feenberg, Simon Fraser University, Canada. Luciano Floridi, University of Hertfordshire & University of Oxford, U.K. Jun Fudano, Kanazawa Institute of Technology, Japan. Sven Ove Hansson, Royal Institute of Technology, Sweden. Vincent F. Hendricks, University of Copenhagen, Denmark & Columbia University, U.S.A. Jeroen van den Hoven, Delft University of Technology, the Netherlands. Don Ihde, Stony Brook University, U.S.A. Billy V. Koen, University of Texas, U.S.A. Peter Kroes, Delft University of Technology, the Netherlands. Sylvain Lavelle, ICAM-Polytechnicum, France. Michael Lynch, Cornell University, U.S.A. Anthonie Meijers, Eindhoven University of Technology, the Netherlands. Sir Duncan Michael, Ove Arup Foundation, U.K. Carl Mitcham, Colorado School of Mines, U.S.A. Helen Nissenbaum, New York University, U.S.A. Alfred Nordmann, Technische Universität Darmstadt, Germany. Joseph Pitt, Virginia Tech, U.S.A. Daniel Sarewitz, Arizona State University, U.S.A. Jon A. Schmidt, Burns & McDonnell, U.S.A. Peter Simons, Trinity College Dublin, Ireland. John Weckert, Charles Sturt University, Australia.
For further volumes: http://www.springer.com/series/8657
Marc J. de Vries • Sven Ove Hansson Anthonie W.M. Meijers Editors
Norms in Technology
Editors Marc J. de Vries Eindhoven University of Technology Eindhoven, the Netherlands
Sven Ove Hansson Royal Institute of Technology Stockholm, Sweden
Anthonie W.M. Meijers Eindhoven University of Technology Eindhoven, the Netherlands
ISSN 1879-7202 ISSN 1879-7210 (electronic) ISBN 978-94-007-5242-9 ISBN 978-94-007-5243-6 (eBook) DOI 10.1007/978-94-007-5243-6 Springer Dordrecht Heidelberg New York London Library of Congress Control Number: 2012954386 © Springer Science+Business Media Dordrecht 2013 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Exempted from this legal reservation are brief excerpts in connection with reviews or scholarly analysis or material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Duplica
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