• PDF / 12,365,474 Bytes
• 357 Pages / 439.42 x 683.15 pts Page_size
• 77 Downloads / 257 Views

DOWNLOAD

REPORT

---

troduction to Statistics in Metrology

Introduction to Statistics in Metrology

Stephen Crowder • Collin Delker • Eric Forrest Nevin Martin

Introduction to Statistics in Metrology

Stephen Crowder Sandia National Laboratories Albuquerque, NM, USA

Collin Delker Sandia National Laboratories Albuquerque, NM, USA

Eric Forrest Sandia National Laboratories Albuquerque, NM, USA

Nevin Martin Sandia National Laboratories Albuquerque, NM, USA

ISBN 978-3-030-53328-1 ISBN 978-3-030-53329-8 https://doi.org/10.1007/978-3-030-53329-8

(eBook)

© Springer Nature Switzerland AG 2020 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors, and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Switzerland AG The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland

To Lee, Leah, Stephen, Colleen, and Anna—S.V.C. To Kim, David, and Shawn—C.J.D. To Lisa, Cari, and Lyla—E.C.F. To Zane, Andy, and Josie—N.S.M.

Preface

This book is the result of many years of collaboration between the Primary Standards Laboratory and the Statistical Sciences Department at Sandia National Laboratories. Project work together, publications, and many discussions regarding how to best use statistics in metrology have culminated in this manuscript. With this book, we wish to present statistical best practices to both students and practitioners of metrology. The book brings together in one place many of the basic statistical methods that have been applied to problems in metrology, plus much more. It not only includes methods presented in the JCGM 100 “Guide to the Expression of Uncertainty in Measurement” (aka, the GUM), but also presents topics in metrology seldom covered elsewhere. These topics include the design of experiments and statistical process control in metrology, uncertainties in curve fitting, assessment of binary measurement systems, and sample size det