Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam
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MRS Advances © 2019 Materials Research Society DOI: 10.1557/adv.2019.368
Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing — ERRATUM Sukesh Ram, Amber A. Chow, Shaurya Khanna, Nikhil C. Suresh, Franscesca J. Ark, Saaketh R. Narayan, Aashi R. Gurijala, Jack M. Day, Timothy Karcher, Robert J. Culbertson, Shawn D. Whaley, Karen L. Kavanagh and Nicole Herbots
In the title of this article1, the chemical formula “GaAs” was misspelled. This has been corrected in the original article. The publisher regrets this error.
Reference: 1. S. Ram, A.A. Chow, S. Khanna, N.C. Suresh, F.J. Ark, S.R. Narayan, A.R. Gurijala, J.M. Day, T. Karcher, R.J. Culbertson, S.D. Whaley, K.L. Kavanagh, and N. Herbots, MRS Advances 1 (2019).
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