X-ray diffraction and X-ray standing-wave study of the lead stearate film structure
- PDF / 720,788 Bytes
- 9 Pages / 612 x 792 pts (letter) Page_size
- 102 Downloads / 135 Views
RACTION AND SCATTERING OF IONIZING RADIATIONS
X-Ray Diffraction and X-Ray Standing-Wave Study of the Lead Stearate Film Structure A. E. Blagova,b, Yu. A. Dyakovaa,b, M. V. Kovalchuka,b, V. G. Kohna,b, M. A. Marchenkovaa,b, Yu. V. Pisarevskiy a,b, and P. A. Prosekova,b a
Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333 Russia bNational Research Centre “Kurchatov Institute”, pl. Akademika Kurchatova 1, Moscow, 123182 Russia e-mail: [email protected] Received November 27, 2015
Abstract—A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface. DOI: 10.1134/S1063774516030044
INTRODUCTION Currently, the study of organic films on solid substrates is of particular interest in view of the possibility of using them as components of hybrid systems. Organic molecules have various properties, because they perform all functions in living systems; at the same time, modern technologies provide many possibilities for the directed synthesis of these molecules. Inorganic materials are widely and successfully applied in different fields of industry, including electronics and acoustooptics, and their well-developed growth technology makes it possible to obtain crystals with high structural quality. Thus, hybrid systems based on a combination of organic materials and classical inorganic substrates are promising elements for various new-generation devices. Organic films and crystals are generally characterized by large interplanar spacings. Correspondingly, special methods and approaches should be developed to study the structural characteristics of organic components. The functional properties of organic films are known to depend on the degree of their structural quality. Therefore, it is important to develop and adapt phase-sensitive methods for studying hybrid systems which could yield detailed information about small deviations of structure from periodicity. In this paper we propose a method for studying crystal structure quality similar to the X-ray standingwave method without measuring secondary processes [1–4], which uses multiwave interaction of diffracted
beams corresponding to different harmonics of one reflection (i.e., different orders of reflection from one set of crystal planes). Using the proposed adapted X-
Data Loading...
