X-Ray Diffraction for Materials Research: From Fundamentals to Applications Myeongkyu Lee
- PDF / 274,293 Bytes
- 1 Pages / 585 x 783 pts Page_size
- 79 Downloads / 178 Views
for metal oxide systems, and presents the calculation of the maximum reaction rate from equilibrium thermodynamics. Chapter 8 is devoted to electrochemical reactions and Pourbaix diagrams with application examples. Chapter 9 concludes this volume with the application of a model of multiple microstates to Ce and Fe3Pt. CALPHAD modeling is briefly discussed in the context of genomics of materials. The book introduces basic thermodynamic concepts clearly and directs readers to appropriate references for advanced concepts and details of software implementation. The list of references is quite comprehensive. The authors make liberal use of diagrams to illustrate key concepts. The two appendices discuss software requirements and the file structure, and present templates for special quasi-random
X-Ray Diffraction for Materials Research: From Fundamentals to Applications Myeongkyu Lee Apple Academic Press and CRC Press, 2016 302 pages, $159.95 (e-book $111.97) ISBN 9781771882989
X
-ray diffraction (XRD) is a powerful nondestructive characterization technique for determining the structure, phase, composition, and strain in materials. It is one of the most frequently employed methods for characterizing materials. This book distinguishes itself from other books on this topic by its simplified treatment and its coverage of thin-film analysis. It largely minimizes the mathematics and is profusely illustrated, making it a good entry point for learning the basic principles of XRD. The common thin-film structures (random polycrystalline, textured) and their relationships with the substrate (strain, in-plane rotation) are defined and explained. This makes it valuable to researchers who study thin-film deposition. The book includes example problems to reinforce the concepts covered, plus problems that can be assigned as homework.
The background physics is presented first. Chapter 1 covers the properties of electromagnetic radiation, including wave-particle duality and the generation of x-rays. Chapter 2 describes crystal geometry, explaining the concept of a lattice and how Miller indices are assigned to planes and directions, reciprocal lattices, and crystal structures. The scope of this treatment is above that found in introductory materials science and engineering textbooks. The interaction of electromagnetic radiation with materials is discussed in chapter 3, including interference and diffraction. Many of these topics will be familiar to those who have taken college physics, but here they are described with an emphasis on their importance to XRD. After establishing the basic physics, the book describes the conditions required for XRD to occur in chapter 4. Bragg’s Law and the Laue equations are presented and
structures. There is also a link to download pre-compiled binary files of the YPHON code for Linux or Microsoft Windows systems. The exercises at the end of the chapters assume that the reader has access to VASP, which is not freeware. Readers without access to this code can work on a limited number of exercises. Howev
Data Loading...
