Ageing of Integrated Circuits Causes, Effects and Mitigation Techniq
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient c
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Ageing of Integrated Circuits Causes, Effects and Mitigation Techniques
Ageing of Integrated Circuits
Basel Halak Editor
Ageing of Integrated Circuits Causes, Effects and Mitigation Techniques
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Editor Basel Halak The School of Electronics and Computer Science University of Southampton Southampton, UK
ISBN 978-3-030-23780-6 ISBN 978-3-030-23781-3 (eBook) https://doi.org/10.1007/978-3-030-23781-3 © Springer Nature Switzerland AG 2020 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors, and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Switzerland AG. The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland
To my parents as well as Suzanne, Hanin, and Sophia with love
Preface
The ageing of an organism in biology is defined as a progressive, irreversible process that inevitably ends with death. The maximal lifetime of an individual is significantly affected by ageing. The same is true for integrated circuits wherein ageing can be caused by several physical mechanisms, including bias temperature instability (BTI), hot carrier injection (HCI), and time-dependent dielectric breakdown (TDDB). Ageing effects lead to a degradation in the performance and reliability of an electronic system, hence limiting its expected lifetime. Variation-aware design techniques, such as conservative safety margins, can be used to reduce the impact of ageing on system reliability; however, the applications of such methods make it harder to develop competitive products and may lead to the elimination of performance gains of technology scaling. Therefore, there is a need for innovative approaches to improve the resilience of integrated circuit to ageinginduced failure without affecting its performance. The prime objective of this book is to provide a timely and coherent account of the latest advances in the key research areas of IC’
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