An Exploration of Microscopy for Educational Applications in the High School Classroom
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An Exploration of Microscopy for Educational Applications in the High School Physics Classroom R. Fitzsimmons1, R. Koekkoek2, C. Caragianis-Broadbridge3, A. Lehman3 and K. Cummings Department of Physics, Southern Connecticut State University, New Haven, CT ABSTRACT This project was initiated with an undergraduate student’s exploration of two advanced research tools: the scanning electron microscope (SEM) and the atomic force microscope (AFM). A research project was developed to study the application of microscopy to introductory physics instruction. Nine modules covering various aspects of introductory physics were created. Module components included discussions, laboratory experiments and assessments. Four of the nine modules were implemented in various high school classes. Assessments were used to compare student learning with the modules versus standard textbook/lecture techniques. Preliminary results of this study are presented along with recently developed methods created to facilitate implementation of these modules within the high school classroom. INTRODUCTION The high school student’s perception of cutting edge science is sometimes far removed from reality. For instance, in a high school student’s mind, high magnification microscopy may very well be demonstrated by the compound optical microscope that is used in sophomore biology class. As far as the student is concerned, two or three hundred times magnification is indicative of a powerful instrument. This magnification is still much lower than the advanced microscopy discussed in this paper. Unfortunately, the cost of an electron or atomic force microscope makes those devices prohibitively expensive. This project was designed to introduce high school aged students to higher level microscopy, without requiring high schools to spend the amount of money required to purchase the devices. The project was completed in two phases. The first phase dealt with the use of the atomic force microscope (AFM). High school students were tested on their preconceived notions of microscopy and related physics applications before being given a short lecture on AFM. They were then tested again and the results of the pre- and post-tests were compared. The second phase of the project consisted of designing a series of lessons that would allow the high school teacher to introduce scanning electron microscopy (SEM) to 1
New Milford High School, New Milford, CT
2
Ridgefield High School, Ridgefield, CT
3
Center for Research on Interface Structures and Phenomena (CRISP), an NSF MRSEC
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the high school student. The fundamentals of optical magnification and microscopy as well as those of SEM are addressed and activities involving the use of the SEM are included. Videotaped lessons demonstrating the use of the SEM and the images produced by the instrument allow for a low cost alternative to purchasing an SEM. RESULTS AND DISCUSSION The first phase of the program introduced the concept of AFM to high school level students. The students were presented
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