Analysis of ENDOR Spectra

The analysis of ENDOR spectra proceeds in the same way no matter whether the spectra were obtained by conventional stationary ENDOR, by optical detection using the MCDA technique or using luminescence or by electrical detection using the NMR and EPR-induc

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51

MATERIALS SCIENCE

Springer-Verlag Berlin Heidelberg GmbH

Physics and Astronomy

ONLINE LIBRARY

http://www.springer.de/phys/

Springer Series in

MATERIALS SCIENCE Editors: R. Hull

R. M. Osgood, Jr.

J. Parisi

The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials. 51 Point Defects

in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions By J.-M. Spaeth and H. Overhof

52 Polymer Films with Embedded Metal Nanoparticles By A. Heilmann

56 Si0 2 in Si Microdevices

ByM.Itsumi

57 Radiation Effects

in Advanced Semiconductor Materials and Devices By C. Claeys and E. Simoen

58 Functional Thin Films

and Functional Materials New Concepts and Technologies Editor: D. Shi

53 Nanocrystalline Ceramics

59 Dielectric Properties of Porous Media

54 Electronic Structure and Magnetism

60 Organic Photovoltaics Concepts and Realization Editors: C. Brabec, V. Dyakonov, J. Parisi and N. Sariciftci

Synthesis and Structure By M. Winterer

of Complex Materials Editors: D.J. Singh and A. Dimitrios

By S.O. Gladkov

55 Quasicrystals

An Introduction to Structure, Physical Properties and Applications Editors: J.-B. Suck, M. Schreiber, and P. Haussler

Series homepage - http://www.springer.de/phys/books/ssms/ Volumes 1-50 are listed at the end of the book.

J.-M. Spaeth

H.Overhof

Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

With 279 Figures

,

Springer

Professor Dr. Johann-Martin Spaeth Professor Dr. Harald Overhof Fachbereich Physik

Universităt Paderborn

Warburger StraBe 100 33095 Paderborn

Germany e-mail: [email protected] [email protected]

Series Editors: Professor R. M. Osgood, Jr. Microelectronics Science Laboratory, Department of Electrical Engineering Columbia University, Seeley W. Mudd Building, New York, NY 10027, USA

Professor Robert Huli University of Virginia, Dept. ofMaterials Science and Engineering, Thornton HalI Charlottesville, VA 22903-2442, USA

Professor Jiirgen Parisi Universităt Oldenburg, Fachbereich Physik, Abt. Energie- und Halbleiterforschung Carl-von-Ossietzky-Strasse 9-11, 26129 Oldenburg, Germany

Guest Editors: Professor Hans-Joachim Queisser Max-Planck-Institut fiir Festkorperforschung, Abt. Experimentelle Physik Heisenbergstrasse 1, 70569 Stuttgart, Germany

ISSN 0933-033x ISBN 978-3-642-62722-4

ISBN 978-3-642-55615-9 (eBook)

DOI 10.1007/978-3-642-55615-9 Ubrary of Congress Cataloging-in-Publication Data applied for. A catalog record for this book is available from the Ubrary of Congress. Bibliographic information published by Die Deutsche Bibliothek Die