Analysis of ENDOR Spectra
The analysis of ENDOR spectra proceeds in the same way no matter whether the spectra were obtained by conventional stationary ENDOR, by optical detection using the MCDA technique or using luminescence or by electrical detection using the NMR and EPR-induc
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		    51
 
 MATERIALS SCIENCE
 
 Springer-Verlag Berlin Heidelberg GmbH
 
 Physics and Astronomy
 
 ONLINE LIBRARY
 
 http://www.springer.de/phys/
 
 Springer Series in
 
 MATERIALS SCIENCE Editors: R. Hull
 
 R. M. Osgood, Jr.
 
 J. Parisi
 
 The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials. 51 Point Defects
 
 in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions By J.-M. Spaeth and H. Overhof
 
 52 Polymer Films with Embedded Metal Nanoparticles By A. Heilmann
 
 56 Si0 2 in Si Microdevices
 
 ByM.Itsumi
 
 57 Radiation Effects
 
 in Advanced Semiconductor Materials and Devices By C. Claeys and E. Simoen
 
 58 Functional Thin Films
 
 and Functional Materials New Concepts and Technologies Editor: D. Shi
 
 53 Nanocrystalline Ceramics
 
 59 Dielectric Properties of Porous Media
 
 54 Electronic Structure and Magnetism
 
 60 Organic Photovoltaics Concepts and Realization Editors: C. Brabec, V. Dyakonov, J. Parisi and N. Sariciftci
 
 Synthesis and Structure By M. Winterer
 
 of Complex Materials Editors: D.J. Singh and A. Dimitrios
 
 By S.O. Gladkov
 
 55 Quasicrystals
 
 An Introduction to Structure, Physical Properties and Applications Editors: J.-B. Suck, M. Schreiber, and P. Haussler
 
 Series homepage - http://www.springer.de/phys/books/ssms/ Volumes 1-50 are listed at the end of the book.
 
 J.-M. Spaeth
 
 H.Overhof
 
 Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
 
 With 279 Figures
 
 ,
 
 Springer
 
 Professor Dr. Johann-Martin Spaeth Professor Dr. Harald Overhof Fachbereich Physik
 
 Universităt Paderborn
 
 Warburger StraBe 100 33095 Paderborn
 
 Germany e-mail: [email protected] [email protected]
 
 Series Editors: Professor R. M. Osgood, Jr. Microelectronics Science Laboratory, Department of Electrical Engineering Columbia University, Seeley W. Mudd Building, New York, NY 10027, USA
 
 Professor Robert Huli University of Virginia, Dept. ofMaterials Science and Engineering, Thornton HalI Charlottesville, VA 22903-2442, USA
 
 Professor Jiirgen Parisi Universităt Oldenburg, Fachbereich Physik, Abt. Energie- und Halbleiterforschung Carl-von-Ossietzky-Strasse 9-11, 26129 Oldenburg, Germany
 
 Guest Editors: Professor Hans-Joachim Queisser Max-Planck-Institut fiir Festkorperforschung, Abt. Experimentelle Physik Heisenbergstrasse 1, 70569 Stuttgart, Germany
 
 ISSN 0933-033x ISBN 978-3-642-62722-4
 
 ISBN 978-3-642-55615-9 (eBook)
 
 DOI 10.1007/978-3-642-55615-9 Ubrary of Congress Cataloging-in-Publication Data applied for. A catalog record for this book is available from the Ubrary of Congress. Bibliographic information published by Die Deutsche Bibliothek Die		
 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	