Applications of Graphene and Graphene-Oxide Based Nanomaterials Sekhar Chandra Ray
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Applications of Graphene and Graphene-Oxide Based Nanomaterials Sekhar Chandra Ray Elsevier, 2015 92 pages, $49.95 ISBN 978-0-323-37521-4
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his book falls into Elsevier’s Micro and Nano Technologies series. Graphene belongs to an outstanding new class of 2D materials that has opened up new avenues into low-dimensional physics and chemistry. Graphene’s high mechanical strength, large surface area, and superior electrical and thermal conductivities have opened up avenues for new devices in a variety of applications, such as electronics and optoelectronics. The progress in this field is exceptionally fast, making headway for new developments. A number of books have been published at an advanced level and are available in the market to satisfy the experts. However, very few books on graphene address the
needs of beginners. In this context, the present book is a small-sized edition on graphene written in three chapters with the following coverage. Chapter 1 is devoted to the application and uses of graphene, with textual material of 31 pages and references running to 7.5 pages. Chapter 2 describes applications and uses of graphene oxide and reduced graphene oxide, with 17 pages and 2.5 pages of references. Chapter 3 is on graphene-based carbon nanoparticles for bioimaging applications, with 22 textual pages and 3.5 pages of references. The first two chapters are written by the author of the book, and the third is co-written with Nikhil R. Jana. The book offers short reviews of a variety
Reviewer: K.S.V. Santhanam is a professor in the School of Chemistry and Materials Science at the Rochester Institute of Technology, USA.
extended description of the mechanics governing different oscillating modes of atomic force microscopy. In order to make difficult concepts accessible, important and useful equations are developed clearly, with step-by-step explanations. Each chapter starts with a short introduction, and ends with a ½–1 page bulleted summary of the key points. In addition to the topics mentioned previously, there are chapters on artifacts, image analysis, and manipulation, and a few SPM applications such as contact potential measurements, manipulation at the atomic scale, mechanical characterization, and surface spectroscopy. Where necessary, brief discussions on related topics such as surface states and electrostatics are inserted. This is definitely not a “how to” book, and certainly not an exhaustive treatment of SPM: for instance, the vital practical topic of image processing is treated in a very cursory way, and data
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy Bert Voigtländer Springer-Verlag, 2015 382 pages, $179.00 (e-book $139.00) ISBN 978-3-662-45240-0
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onsidering the number of excellent books that have been written to date on this topic, one may ask what another book on scanning probe microscopy (SPM) fundamentals can add to the existing texts. The answer lies in the extent of this burgeoning field. No single work is likely to cover it all, but a good book sho
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