Astronomical Image and Data Analysis
With information and scale as central themes, this comprehensive survey explains how to handle real problems in astronomical data analysis using a modern arsenal of powerful techniques. It treats those innovative methods of image, signal, and data process
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G. Börner, Garching, Germany A. Burkert, München, Germany W. B. Burton, Charlottesville, VA, USA and Leiden, The Netherlands M. A. Dopita, Canberra, Australia A. Eckart, Köln, Germany T. Encrenaz, Meudon, France B. Leibundgut, Garching, Germany J. Lequeux, Paris, France A. Maeder, Sauverny, Switzerland V. Trimble, College Park, MD, and Irvine, CA, USA
J.-L. Starck
F. Murtagh
Astronomical Image and Data Analysis Second Edition With 119 Figures
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Jean-Luc Starck Service d’Astrophysique CEA/Saclay Orme des Merisiers, Bat 709 91191 Gif-sur-Yvette Cedex, France
Fionn Murtagh Dept. Computer Science Royal Holloway University of London Egham, Surrey TW20 0EX, UK
Cover picture: The cover image to this 2nd edition is from the Deep Impact project. It was taken approximately 8 minutes after impact on 4 July 2005 with the CLEAR6 filter and deconvolved using the Richardson-Lucy method. We thank Don Lindler, Ivo Busko, Mike A’Hearn and the Deep Impact team for the processing of this image and for providing it to us.
Library of Congress Control Number: 2006930922
ISSN 0941-7834 ISBN-10 3-540-33024-0 2nd Edition Springer Berlin Heidelberg New York ISBN-13 978-3-540-33024-0 2nd Edition Springer Berlin Heidelberg New York ISBN 3-540-42885-2 1st Edition Springer Berlin Heidelberg New York This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable to prosecution under the German Copyright Law. Springer is a part of Springer Science+Business Media springer.com Springer-Verlag Berlin Heidelberg 2006 The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: by the authors Final layout: Data conversion and production by LE-TEX Jelonek, Schmidt & VöcklerGbR, Leipzig, Germany Cover design: design & production GmbH, Heidelberg Printed on acid-free paper
SPIN: 11595496
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Preface to the Second Edition
This book presents material which is more algorithmically oriented than most alternatives. It also deals with topics that are at or beyond the state of the art. Examples include practical and applicable wavelet and other multiresolution transform analysis. New areas are broached like the ridgelet and curvelet transforms. The reader will find in this book an engineering approach to the interpretation of scientific data. Compared to the 1st Edition, various additions have been made throughout, and the topics covered have been
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