Beam Instrumentation and Diagnostics
This treatise covers all aspects of the design and the daily operations of a beam diagnostic system for a large particle accelerator. A very interdisciplinary field, it involves contributions from physicists, electrical and mechanical engineers and comput
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Beam Instrumentation and Diagnostics
Particle Acceleration and Detection springer.com The series Particle Acceleration and Detection is devoted to monograph texts dealing with all aspects of particle acceleration and detection research and advanced teaching. The scope also includes topics such as beam physics and instrumentation as well as applications. Presentations should strongly emphasise the underlying physical and engineering sciences. Of particular interest are • contributions which relate fundamental research to new applications beyond the immediate realm of the original field of research • contributions which connect fundamental research in the aforementioned fields to fundamental research in related physical or engineering sciences • concise accounts of newly emerging important topics that are embedded in a broader framework in order to provide quick but readable access of very new material to a larger audience The books forming this collection will be of importance for graduate students and active researchers alike. Series Editors: Professor Alexander Chao SLAC 2575 Sand Hill Road Menlo Park, CA 94025 USA Professor Christian W. Fabjan CERN PPE Division 1211 Genève 23 Switzerland Professor Rolf-Dieter Heuer DESY Gebäude 1d/25 22603 Hamburg Germany
Professor Takahiko Kondo KEK Building No. 3, Room 319 1-1 Oho, 1-2 1-2 Tsukuba 1-3 1-3 Ibaraki 305 Japan Professor Franceso Ruggiero CERN SL Division 1211 Genève 23 Switzerland
Peter Strehl
Beam Instrumentation and Diagnostics With 301 Figures
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Peter Strehl Händelstrasse 32 64291 Darmstadt Germany E-mail: [email protected]
Library of Congress Control Number: 2005937154 ISSN 1611-1052 ISBN-10 3-540-26401-9 Springer Berlin Heidelberg New York ISBN-13 978-3-540-26401-9 Springer Berlin Heidelberg New York This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable for prosecution under the German Copyright Law. Springer is a part of Springer Science+Business Media springer.com c Springer-Verlag Berlin Heidelberg 2006 Printed in The Netherlands The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: by the author and TechBooks using a Springer LATEX macro package Cover design: design & production GmbH, Heidelberg Printed on acid-free paper
SPIN: 10989920
54/TechBooks
543210
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