Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy
X-ray photoemission electron microscopy (XPEEM) is a full-field imaging technique giving access to the chemical state and magnetic order of laterally inhomogeneous surfaces, interfaces and thin films. In its simplest variant, synchrotron-based PEEM uses s
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Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy Andrea Locatelli and Tevfik Onur Mente¸s
Abstract X-ray photoemission electron microscopy (XPEEM) is a full-field imaging technique giving access to the chemical state and magnetic order of laterally inhomogeneous surfaces, interfaces and thin films. In its simplest variant, synchrotronbased PEEM uses secondary emission to map local differences in the oxidation state, valence, and bond orientation around the emitter. The combination with X-ray circular and linear dichroism techniques represents the most frequent application, and has found extensive use in imaging ferromagnetic and antiferromagnetic domains. XPEEM instruments with energy filter can implement laterally resolved X-ray photoelectron spectroscopy (XPS) and angle resolved photoelectron spectroscopy (ARPES), reaching high chemical and electronic structure sensitivity. Here, we describe the basic aspects and methods of synchrotron-based spectromicroscopy with the PEEM, and its combination with low energy electron microscopy (LEEM). The present state of the art of the technique will be illustrated by applications in diverse fields, spanning from surface and materials sciences to biology and magnetism.
21.1 Introduction The investigation of nanostructured materials and composite interfaces necessitates analytical characterization methods that combine the capabilities of X-ray photoemission spectroscopy with those of microscopy at the nanometer scale. The high brilliance of third generation synchrotron radiation sources has promoted the rapid A. Locatelli (B) · T. O. Mente¸s Elettra-Sincrotrone Trieste S.C.p.A., Strada Statale 14, km 163.5 Area Science Park, 34149 Basovizza, Trieste, Italy e-mail: [email protected] T. O. Mente¸s e-mail: [email protected]
S. Mobilio et al. (eds.), Synchrotron Radiation, DOI: 10.1007/978-3-642-55315-8_21, © Springer-Verlag Berlin Heidelberg 2015
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A. Locatelli and T. O. Mente¸s
development of a variety of spectromicroscopic investigation tools, either implementing the scanning or the full-field approach [1]. They enable laterally resolved versions of the most popular X-ray spectroscopies, providing chemical, magnetic and electronic structure sensitivity. Among them, one of the most prominent is photoemission electron microscopy (PEEM), often used in combination with X-ray absorption spectroscopy and its close derivatives, circular and linear magnetic dichroism [2, 3]. Energy filtering capability and combination with low energy electron microscopy (LEEM) have further widened the application field of synchrotron radiation photoemission electron microscopy, paving the way to the use of electron spectroscopy for the chemical characterization of nanomaterials at high lateral resolution [4]. The last decade has witnessed a rebirth of the early interest in geology and biology, with several new developments in the study of biominerals [5]. PEEM has a long and exciting history [6], whose beginning dates in 1933, when the German phys
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