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Workshop Focuses on Analysis and Interprétation of Neutron Reflectivity Data A workshop held August 23-25, 1990 at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory focused on the status of instrumental, theoretical and analytical techniques in neutron reflectivity. The workshop was sponsored by the Department of Energy's Office of Basic Energy Sciences, the University of Chicago, and the Division of Education Programs at Argonne National Laboratory. The workshop brought together 65 scientists from the international polymer science, materials science, condensed matter physics and mathematics communities who are actively performing research using neutron and x-ray reflectivity, and who are pursuing studies on the surface and interfacial behavior of materials. The proceedings of the workshop will be published in a spécial issue of Physica B. The first day's présentations surveyed the différent observables in the grazing incidence geometry. J. Penfold (RutherfordAppleton Laboratory) began with a discussion of time-of-flight and fixedwavelength neutron reflectometers. S. Sinha (Brookhaven National Laboratory) followed with a critical comparison and description of the complementary nature of x-ray and neutron reflectivity. His lecture, along with that of A. Steyerl (University of Rhode Island), also dealt with the measurement and interprétation of, and problems associated with off-specular or diffuse scattering. Finally, CF. Majkrzak (National Institute of Standards and Technology) discussed the expérimental methods for producing and detecting polarized neutrons for the study of surface magnetism. The second day was dedicated to the methods for extracting information (depth profiles) from reflectivity data. J. Lekner (Victoria University of Wellington) began with a lecture on the theory of reflectivity and some limitations on interpreting reflectivity experiments. Complementing this was a lecture by D.S. Sivia (Los Alamos National Laboratory) dealing with the détails of maximum entropy and Boyesian spectral analysis for deterrnining the scattering length density profiles from experiment and elucidated several pitfalls encountered in handling data. Contrast variation techniques for suppressing background and highlighting spécifie components of a spécimen were treated by R.
MRS BULLETIN/NOVEMBER1990
Thomas (Oxford University). The unsolved "inverse problem" was then discussed by T. Roberts (Ames Laboratory), who presented some analytic approaches coupled with numerical analysis by which the "inverse problem" could be addressed. At the end of the day, D. Mill (Argonne National Laboratory) presented the potentials of x-ray reflectivity and other surface sensitive techniques at the planned Advanced Photon Source. On the third morning, some experienced users presented their views on neutron reflectivity. In particular, lectures were presented by J. Higgins (Impérial Collège) and E.J. Kramer (Cornell University). In the first présentation the possibility of performing straightforward and simple analyses
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