Digital Timing Measurements From Scopes and Probes to Timing and Jit
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour,
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FRONTIERS IN ELECTRONIC TESTING Consulting Editor Vishwani D. Agrawal Books in the series: Fault-Tolerance Techniques for SRAM-based FPGAs Kastensmidt, F.L., Carro, L. (et al.), Vol. 32 ISBN: 0-387-31068-1 Data Mining and Diagnosing IC Fails Huisman, L.M., Vol. 31 ISBN: 0-387-24993-1 Fault Diagnosis of Analog Integrated Circuits Kabisatpathy, P., Barua, A. (et al.), Vol. 30 ISBN: 0-387-25742-X Introduction to Advanced System-on-Chip Test Design and Optimi… Larsson, E., Vol. 29 ISBN: 1-4020-3207-2 Embedded Processor-Based Self-Test Gizopoulos, D. (et al.), Vol. 28 ISBN: 1-4020-2785-0 Advances in Electronic Testing Gizopoulos, D. (et al.), Vol. 27 ISBN: 0-387-29408-2 Testing Static Random Access Memories Hamdioui, S., Vol. 26 ISBN: 1-4020-7752-1 Verification By Error Modeling Redecka, K. and Zilic, Vol. 25 ISBN: 1-4020-7652-5 Elements of STIL: Principles and Applications of IEEE Std. 1450 Maston, G., Taylor, T. (et al.), Vol. 24 ISBN: 1-4020-7637-1 Fault injection Techniques and Tools for Embedded systems Reliability… Benso, A., Prinetto, P. (Eds.), Vol. 23 ISBN: 1-4020-7589-8 Power-Constrained Testing of VLSI Circuits Nicolici, N., Al-Hashimi, B.M., Vol. 22B ISBN: 1-4020-7235-X High Performance Memory Memory Testing Adams, R. Dean, Vol. 22A ISBN: 1-4020-7255-4 SOC (System-on-a-Chip) Testing for Plug and Play Test Automation Chakrabarty, K. (Ed.), Vol. 21 ISBN: 1-4020-7205-8 Test Resource Partitioning for System-on-a-Chip Chakrabarty, K., Iyengar & Chandra (et al.), Vol. 20 ISBN: 1-4020-7119-1 A Designers’ Guide to Built-in-Self-Test Stroud, C., Vol. 19 ISBN: 1-4020-7050-0 Boundary-Scan Interconnect Diagnosis de Sousa, J., Cheung, P.Y.K., Vol. 18 ISBN: 0-7923-7314-6 Essentials of Electronic Testing for Digital, Memory, and Mixed Signal VLSI Circuits Bushnell, M.L., Agrawal, V.D., Vol. 17 ISBN: 0-7923-7991-8 Analog and Mixed-Signal Boundary-Scan: A guide to the IEEE 1149.4 Test… Osseiran, A. (Ed.), Vol. 16 ISBN: 0-7923-8686-8
DIGITAL TIMING MEASUREMENTS FROM SCOPES AND PROBES TO TIMING AND JITTER
by
Wolfgang Maichen Teradyne Inc. Agoura Hills, California, USA.
A C.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN-10 ISBN-13 ISBN-10 ISBN-13
0-387-31418-0 (HB) 978-0-387-31418-1 (HB) 0-387-31419-9 (e-book) 978-0-387-31419-8 (e-book)
Published by Springer, P.O. Box 17, 3300 AA Dordrecht, The Netherlands. www.springer.com
Printed on acid-free paper
All Rights Reserved © 2006 Springer No part of this work may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, microfilming, recording or otherwise, without written permission from the Publisher, with the exception of any material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Printed in the Netherlands.
Dedication
This book is dedicated to my wife Gwen and my son Alexandre.
Contents
Dedication
v
Preface
xiii
ELECTRICAL BASICS 1.
1
Time Domain and Frequency
Data Loading...
