Fault Diagnosis of Analog Integrated Circuits
System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digi
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FAULT DIAGNOSIS OF ANALOG INTEGRATED CIRCUITS
by
PRITHVIRAJ KABISATPATHY Biju Patnaik University of Technology, Bhubaneswar, India
ALOK BARUA Indian Institute of Technology, Kharagpur, India and
SATYABROTO SINHA Indian Institute of Technology, Kharagpur, India
A C.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN-10 ISBN-13 ISBN-10 ISBN-13
0-387-25742-X (HB) 978-0-387-25742-6 (HB) 0-387-25743-8 (e-book) 978-0-387-25743-3 (e-book)
Published by Springer, P.O. Box 17, 3300 AA Dordrecht, The Netherlands. www.springeronline.com
Printed on acid-free paper
All Rights Reserved © 2005 Springer No part of this work may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, microfilming, recording or otherwise, without written permission from the Publisher, with the exception of any material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Printed in the Netherlands.
Dedication
To our wives Indrani, Mausumi and Gita To our children Priyasha, Arpita, Santanu and Sandipan
Contents
Dedication
v
Preface
1
Chapter 1
INTRODUCTION
3
1.1
Basic Concepts
4
1.2
Historical Background
8
1.3
Summary
15
References
16
FAULT AND FAULT MODELLING
23
2.1
Introduction
23
2.2
Failure modes in electronic components
25
2.3
Analog fault modelling
27
2.4
Approximation modelling of analog integrated circuits 31
2.5
Summary
Chapter 2
35
viii
Contents Exercises
35
References
37
TEST STIMULUS GENERATION
41
3.1
Introduction
41
3.2
Conventional analog test stimulus generation
44
3.3
Digital test stimulus generation
49
3.4
Delta sigma (ǻ-Ȉ) signal generation
53
3.5
Pseudorandom noise generation
60
3.6
Summary
67
Exercises
68
References
69
FAULT DIAGNOSIS METHODOLOGY
73
4.1
Introduction
73
4.2
Fault diagnosis procedure
74
4.3
Fault dictionary techniques
75
4.4
DSP based techniques
79
4.5
Model based observer technique
82
4.6
Experimental verification of the model based observer technique
122
Summary
130
Exercises
130
References
131
Chapter 3
Chapter 4
4.7
Contents Chapter 5
ix DESIGN FOR TESTABILITY AND BUILT-IN-SELF-TEST
133
5.1
Introduction
133
5.2
Design-for-testability approaches
136
5.3
Increased testability with test bus
142
5.4
Built-in-self-test
145
5.5
Summary
149
References
149
Appendix A
153
Appendix B
159
Appendix C
169
Notes
177
Index
179
Preface
The field of integrated circuit has undergone remarkable changes over the past decade. Integrated circuits incorporating both digital and analog function have become more and more popular in semiconductor industry. These combined circuits are called “Mixed Signal Circuits”. Fault diagnosis and testing of integrated circuit has grown into a special field of interest in semiconductor industry. The methodologies for testing of digital circuits are well established. However
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