Field Emission Scanning Electron Microscopy New Perspectives for Mat
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron m
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Nicolas Brodusch Hendrix Demers Raynald Gauvin
Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization 123
SpringerBriefs in Applied Sciences and Technology Series editor Janusz Kacprzyk, Polish Academy of Sciences, Systems Research Institute, Warsaw, Poland
SpringerBriefs present concise summaries of cutting-edge research and practical applications across a wide spectrum of fields. Featuring compact volumes of 50– 125 pages, the series covers a range of content from professional to academic. Typical publications can be: • A timely report of state-of-the art methods • An introduction to or a manual for the application of mathematical or computer techniques • A bridge between new research results, as published in journal articles • A snapshot of a hot or emerging topic • An in-depth case study • A presentation of core concepts that students must understand in order to make independent contributions SpringerBriefs are characterized by fast, global electronic dissemination, standard publishing contracts, standardized manuscript preparation and formatting guidelines, and expedited production schedules. On the one hand, SpringerBriefs in Applied Sciences and Technology are devoted to the publication of fundamentals and applications within the different classical engineering disciplines as well as in interdisciplinary fields that recently emerged between these areas. On the other hand, as the boundary separating fundamental research and applied technology is more and more dissolving, this series is particularly open to trans-disciplinary topics between fundamental science and engineering. Indexed by EI-Compendex and Springerlink.
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Nicolas Brodusch Hendrix Demers Raynald Gauvin •
Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization
123
Nicolas Brodusch Department of Mining and Materials Engineering McGill University Montreal, QC Canada
Raynald Gauvin Department of Mining and Materials Engineering McGill University Montreal, QC Canada
Hendrix Demers Department of Mining and Materials Engineering McGill University Montreal, QC Canada
ISSN 2191-530X ISSN 2191-5318 (electronic) SpringerBriefs in Applied Sciences and Technology ISBN 978-981-10-4432-8 ISBN 978-981-10-4433-5 (eBook) https://doi.org/10.1007/978-981-10-4433-5 Library of Congress Control Number: 2017954879 © The Author(s) 2018 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even i
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