High Performance Photoluminescence Spectroscopy using Fourier Transform Interferometry
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HIGH PERFORMANCE PHOTOLUMINESCENCE SPECTROSCOPY USING FOURIER TRANSFORM INTERFEROMETRY M.L.W. THEWALT, M.K. NISSEN, D.J.S. BECKETT AND K.R. LUNDGREN Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
ABSTRACT We present recent results on the applications of Fourier transform techniques to photoluminescence spectroscopy as It relates to both basic and characterIzatIon-related semiconductor research. The emphasis here Is on demonstrating the advantages of these methods in situations requiring very high spectral resolution and/or very high sensitivity. We also provide an example of the utility of interferometry in performing photoluminescence excitation spectroscopy in spectral regions where broadly tunable laser sources are not readily available.
INTRODUCTION Fourier transform (FT) spectroscopy using variations of the Michelson interferometer has long been accepted as the technique of choice for absorption measurements In the mid- to far-infrared (MIR to FIR). More recently, Fourier transform photoluminescence spectroscopy (FTPLS) has been recognized as having certain advantages over the more customary dispersive PLS in the near-infrared (NIR) to MIR region, where sensitive photon-counting detectors such as photomultiplier tubes are as yet unavailable (e.g.: A a l1m).1-4 Here we refer for example to the work of McL Colley and Lightowlers2 on Si characterization using FTPLS, to the existence of a 3 commercial FTPLS system dedicated to Si characterization , and to the recent well-resolved and noise-free FTPLS spectra of the narrow-gap semiconductor 4 InSb presented by Rowell . It Is also becoming evident that various manufacturers of interferometer systems are Increasingly interested In FTPLS
as a new applications area for their products. Even so,
It
seems to us that practitioners
explored and appreciated
of PLS have not yet fully
the major benefits of the FT techniques,
most of the work reported so far could also have available dispersive spectrometers. In addition, very done at all in the shorter wavelength region (A s sensitive photon-counting detectors exist, and FTPLS
in that
been done on readily little FTPLS has been 900nm), where highly is therefore commonly
thought to offer no advantages over dispersive spectrometry. In this paper we will demonstrate some of the unique capabilities of FTPLS with a number of examples of spectroscopy which would range from very difficult to next to Impossible using any practical dispersive spectrometer. Special emphasis is placed on high-resolution FTPLS in the shorter wavelength region (A S 900nm), since it Is here that the capabilities of Interferometry are least appreciated. We will also demonstrate the utility of FT techniques for performing photoluminescence excitation spectroscopy (PLES) in spectral regions where widely-tunable laser sources are not readily available. Before turning to the experimental results, we begin with a brief review of the potential advantages of Interferometry over dispersive spectroscopy.
ADVANTAGES (AND DISADV
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