Including Nanoscale Investigations in Undergraduate Physics Laboratories at all Levels of the Curriculum
- PDF / 646,484 Bytes
- 11 Pages / 612 x 792 pts (letter) Page_size
- 96 Downloads / 158 Views
0931-KK03-02
Including Nanoscale Investigations in Undergraduate Physics Laboratories at all Levels of the Curriculum Kurt Vandervoort, Asif Hyder, Stephanie Barker, and Raul Torrico Physics Dept., California State Polytechnic University, Pomona, CA, 91768 ABSTRACT A series of laboratory modules were developed to introduce atomic force microscope (AFM) applications into undergraduate physics courses. The goal is to elucidate fundamental physics concepts at the nanoscale that will complement existing investigations at the macroscale, and to expose students to advanced instrumentation at an early level. The experiments allow students to experience the full range of scanning probe modes available, which include contact, intermittent contact, lateral force, and magnetic force microscopy as well as force distance spectroscopy. The course levels span the range from freshman introductory to advanced senior level and allow students to experience AFM applications at successive levels of complexity.
INTRODUCTION A series of nanotechnology modules were developed at California State Polytechnic University with support from the NSF-NUE (National Science Foundation - Nanotechnology Undergraduate Education) program. These nanoscale modules were primarily developed for freshman- and sophomore-level physics service courses to supplement existing experiments of macroscale phenomenon. In addition, these introductory modules were modified for more advanced level experiments for placement in our upper-level physics courses. The goals behind these curricular changes were to (1) introduce students to research grade instrumentation at an early level that they may likely encounter in their future careers or in graduate school; (2) create a hierarchy of courses, where students are introduced to advanced instrumentation and experimental techniques at successive stages of complexity from freshman to senior level; and (3) provide cross-disciplinary activities that demonstrate the utility and relevance of physics for majors in other disciplines. This last goal is consistent with the findings of others [1, 2], in science education research, who emphasize the importance of cross-disciplinary diversity for undergraduates as necessary preparation for the current employment market.
EXPERIMENTAL DETAILS The atomic force microscope used in all module development was a Quesant Instruments Universal Scanning Probe Microscope. Commercial silicon cantilevers from MikroMaschTM were employed with resonant frequencies from 8.5-15.5 kHz and spring constants from 0.05-0.3 N/m for contact mode and from 150-190 kHz and from 25-60 N/m for intermittent contact mode. Magnetic Force Microscope cantilevers from Nano SensorsTM were employed with resonant frequencies from 45-115 kHz and spring constants from 0.5-9.5 N/m. The scanning head portion of the microscope was placed on a vibration isolation platform (BM-4 platform from Minus K Technology) to limit influences from floor vibrations and this platform was placed in a chamber
(Novascan) to limit influences from
Data Loading...
