Introduction to Quantum Metrology Quantum Standards and Instrumentat
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantit
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Introduction to Quantum Metrology Quantum Standards and Instrumentation
Introduction to Quantum Metrology
Waldemar Nawrocki
Introduction to Quantum Metrology Quantum Standards and Instrumentation
123
Waldemar Nawrocki Faculty of Electronics and Telecommunications Poznan University of Technology Poznan Poland
The work was first published in 2007 by Wydawnictwo Politechniki Poznańskiej (Publisher of Poznan University of Technology) with the following title: Wstęp do metrologii kwantowej. ISBN 978-3-319-15668-2 DOI 10.1007/978-3-319-15669-9
ISBN 978-3-319-15669-9
(eBook)
Library of Congress Control Number: 2015932516 Springer Cham Heidelberg New York Dordrecht London © Springer International Publishing Switzerland 2015 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper Springer International Publishing AG Switzerland is part of Springer Science+Business Media (www.springer.com)
Preface
Quantum metrology is a field of theoretical and experimental study of high-resolution and high-accuracy methods for measurement of physical quantities based on quantum mechanics, particularly using quantum entanglement. Without equivalent in classical mechanics, quantum entanglement of particles or other quantum systems is an unusual phenomenon in which the state of a system can be determined better than the state of its parts. Attempts are made to use new measurement strategies and physical systems in order to attain measurement accuracy never achieved so far. Quantum metrology sprang into existence at the beginning of the twentieth century, along with quantum mechanics. After all, the Heisenberg uncertainty principle, together with the Schrödinger equation and the Pauli exclusion principle constituting the basis of the formalism of quantum mechanics, is also the fundamental equation of quantum metrology. The uncertainty principle sets limits to measurement accuracy, but has no relation to the technical realization of the measurement. Quantum metrology only
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