Introduction to Quantum Metrology The Revised SI System and Quantum
This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those
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Introduction to Quantum Metrology The Revised SI System and Quantum Standards Second Edition
Introduction to Quantum Metrology
Waldemar Nawrocki
Introduction to Quantum Metrology The Revised SI System and Quantum Standards Second Edition
123
Waldemar Nawrocki Faculty of Electronics and Telecommunications Poznań University of Technology Poznań, Poland
ISBN 978-3-030-19676-9 ISBN 978-3-030-19677-6 https://doi.org/10.1007/978-3-030-19677-6
(eBook)
Original Polish edition published by Wydawnictwo Politechniki Poznańskiej, Poznań, 2007 1st edition: © Springer International Publishing Switzerland 2015 2nd edition: © Springer Nature Switzerland AG 2019 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Switzerland AG The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland
Preface
Quantum metrology is a field of theoretical and experimental study of highresolution and high-accuracy methods for the measurement of physical quantities based on quantum mechanics, particularly using quantum entanglement. Without equivalent in classical mechanics, quantum entanglement of particles or other quantum systems is an unusual phenomenon in which the state of a system can be determined better than the state of its parts. Attempts are made to use new measurement strategies and physical systems in order to attain measurement accuracy never achieved so far. Quantum metrology sprang into existence at the beginning of the twentieth century, along with quantum mechanics. After all, the Heisenberg uncertainty principle, together with the Schrödinger equation and the Pauli exclusion principle constituting the basis of the formalism of quantum mechanics, is also the fundamental equation of quantum metrology. The uncertainty principle sets limits to the measurement accuracy, but has no re
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